Co-Cr-W-C alloy thin films for perpendicular recording media

1987 ◽  
Vol 23 (5) ◽  
pp. 3651-3653 ◽  
Author(s):  
K. Inoue ◽  
M. Yoshikiyo ◽  
S. Yoshii
Keyword(s):  
Thin Films ◽  
Recording Media ◽  
Perpendicular Recording

Effect of oxygen on magnetic properties of Co–Pt–Cr–SiO2 thin films for perpendicular recording media

2005 ◽  
Vol 287 ◽  
pp. 153-158 ◽  
Author(s):  
H. Yamane ◽  
S. Watanabe ◽  
J. Ariake ◽  
N. Honda ◽  
K. Ouchi ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Recording Media ◽  
Perpendicular Recording ◽  
Effect Of Oxygen

Nano-size magnetic crystallite formation in Co-Cr thin films for perpendicular recording media

1998 ◽  
Vol 34 (4) ◽  
pp. 1642-1644 ◽  
Author(s):  
S. Kadokura ◽  
M. Naoe ◽  
S. Nakagawa ◽  
Y. Maeda
Keyword(s):  
Thin Films ◽  
Recording Media ◽  
Perpendicular Recording ◽  
Nano Size

scholarly journals Characterization of Perpendicular Recording Media of CoPtCrO Granular Thin Films.

2001 ◽  
Vol 25 (3−2) ◽  
pp. 226-229 ◽  
Author(s):  
R. Sbiaa ◽  
E. Ahmad ◽  
T. Suzuki ◽  
A. Takeo ◽  
Y. Tanaka
Keyword(s):  
Thin Films ◽  
Recording Media ◽  
Perpendicular Recording

Analytical TEM Examinations of CoPt-TiO2 Perpendicular Magnetic Recording Media

2007 ◽  
Vol 13 (2) ◽  
pp. 70-79 ◽  
Author(s):  
Juliet D. Risner ◽  
Thomas P. Nolan ◽  
James Bentley ◽  
Erol Girt ◽  
Samuel D. Harkness IV ◽  
...  
Keyword(s):  
Thin Films ◽  
Recording Media ◽  
Elemental Distribution ◽  
Magnetic Recording Media ◽  
Perpendicular Recording ◽  
Perpendicular Magnetic Recording ◽  
Analytical Tem ◽  
Pt Alloy ◽  
The Media ◽  
Spectrum Imaging

For this analytical TEM study, nonmagnetic oxygen-rich boundaries were introduced into Co-Pt-alloy perpendicular recording media by cosputtering Co and Pt with TiO2. Increasing the TiO2 content resulted in changes to the microstructure and elemental distribution within grains and boundaries in these films. EFTEM imaging was used to generate composition maps spanning many tens of grains, thereby giving an overall depiction of the changes in elemental distribution occurring with increasing TiO2 content. Comparing EFTEM with spectrum-imaging maps created by high-resolution STEM with EDXS and EELS enabled both corroboration of EFTEM results and quantification of the chemical composition within individual grain boundary areas. The difficulty of interpreting data from EDXS for these extremely thin films is discussed. Increasing the TiO2 content of the media was found to create more uniformly wide Ti- and O-rich grain boundaries as well as Ti- and O-rich regions within grains.

scholarly journals Ferrite-Plated Thin Films for Perpendicular Recording Media

1997 ◽  
Vol 21 (S_2_PMRC_97_2) ◽  
pp. S2_81-84 ◽  
Author(s):  
Yoshitaka KITAMOTO ◽  
Shusuke KANTAKE ◽  
Masanori ABE
Keyword(s):  
Thin Films ◽  
Recording Media ◽  
Perpendicular Recording

Effect of Ni addition into Co ferrite thin films for perpendicular recording media

2000 ◽  
Vol 87 (9) ◽  
pp. 6881-6883 ◽  
Author(s):  
F. Zhang ◽  
Y. Kitamoto ◽  
M. Abe ◽  
M. Naoe
Keyword(s):  
Thin Films ◽  
Recording Media ◽  
Perpendicular Recording ◽  
Ni Addition ◽  
Ferrite Thin Films

X-ray photoelectron spectroscopy of annealed Co-Cr films

1991 ◽  
Vol 49 ◽  
pp. 750-751
Author(s):  
B.G. Demczyk ◽  
H.W. Estry
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Photoelectron Spectroscopy ◽  
Room Temperature ◽  
Recording Media ◽  
Perpendicular Recording ◽  
X Ray ◽  
Alloy Target ◽  
Compositional Changes ◽  
Sputtering System

Co-Cr thin films have been studied extensively as leading candidates for perpendicular recording media. The enhancement of the magnetic properties (saturation magnetization and coercivity) in rfsputtered Co-Cr films has been reported by several investigators. Concurrent work has revealed similar improvements in the magnetic properties of annealed Co-Cr films produced by magnetron sputtering. Honda et al. propose that compositional inhomogeneities in annealed films give rise to these properties changes. In this work, we have employed X-ray photoelectron spectroscopy (XPS) to investigate compositional changes in annealed Co-Cr layers of thickness 10-200 nm.Films were deposited from a Co-22wt%Cr alloy target onto glass (Coming Type 7059) substrates using a Varian DC Magnetron ("S" gun) sputtering system. Sputtering conditions included an argon pressure of lmTorr and room temperature substrates. The sputtering rate was 0.25 nm/sec. Annealing was performed at 360°C in a vacuum (10-6 Torr) in incremental times up to 49 hours.

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