Magnetic field optical sensors using (TbY)IG crystals with stripe magnetic domain structure

2005 ◽  
Vol 41 (10) ◽  
pp. 3640-3642 ◽  
Author(s):  
K. Okubo ◽  
O. Kamada
2006 ◽  
Vol 42 (10) ◽  
pp. 3249-3251 ◽  
Author(s):  
J. B. Kim ◽  
Y. P. Lee ◽  
K. S. Ryu ◽  
S. C. Shin ◽  
H. Akinaga ◽  
...  

2014 ◽  
Vol 23 (6) ◽  
pp. 068103 ◽  
Author(s):  
Ren Xie ◽  
Jun Wei ◽  
Zhong-Wu Liu ◽  
Yan-Mei Tang ◽  
Tao Tang ◽  
...  

2007 ◽  
Vol 48 (8) ◽  
pp. 2255-2257 ◽  
Author(s):  
H. Y. Wang ◽  
X. F. Dai ◽  
Y. G. Wang ◽  
X. F. Duan ◽  
G. H. Wu

Author(s):  
B. G. Demczyk

CoCr thin films have been of interest for a number of years due to their strong perpendicular anisotropy, favoring magnetization normal to the film plane. The microstructure and magnetic properties of CoCr films prepared by both rf and magnetron sputtering have been examined in detail. By comparison, however, relatively few systematic studies of the magnetic domain structure and its relation to the observed film microstructure have been reported. In addition, questions still remain as to the operative magnetization reversal mechanism in different film thickness regimes. In this work, the magnetic domain structure in magnetron sputtered Co-22 at.%Cr thin films of known microstructure were examined by Lorentz transmission electron microscopy. Additionally, domain nucleation studies were undertaken via in-situ heating experiments.It was found that the 50 nm thick films, which are comprised of columnar grains, display a “dot” type domain configuration (Figure 1d), characteristic of a perpendicular magnetization. The domain size was found to be on the order of a few structural columns in diameter.


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