An Investigation of Single Event Transient Response in 45-nm and 32-nm SOI RF-CMOS Devices and Circuits
2013 ◽
Vol 60
(6)
◽
pp. 4405-4411
◽
Single Event Transient Response Dependence on Operating Conditions for a Digital to Analog Converter
2009 ◽
Vol 56
(6)
◽
pp. 3567-3572
◽
Keyword(s):
2002 ◽
Vol 49
(6)
◽
pp. 3115-3120
◽
Keyword(s):
2007 ◽
Vol 54
(6)
◽
pp. 2495-2499
◽
Keyword(s):
2014 ◽
Vol 61
(6)
◽
pp. 3550-3556
◽
2009 ◽
Vol 56
(6)
◽
pp. 3469-3476
◽
Keyword(s):