scholarly journals Statistical Run-Time Verification of Analog Circuits in Presence of Noise and Process Variation

2013 ◽  
Vol 21 (10) ◽  
pp. 1811-1822 ◽  
Author(s):  
Rajeev Narayanan ◽  
Ibtissem Seghaier ◽  
Mohamed H. Zaki ◽  
Sofiene Tahar
2012 ◽  
Vol 47 (1) ◽  
pp. 301-309 ◽  
Author(s):  
Koichi Ishida ◽  
Tsung-Ching Huang ◽  
Kentaro Honda ◽  
Tsuyoshi Sekitani ◽  
Hiroyoshi Nakajima ◽  
...  

Author(s):  
Mohd Azman Abdul Latif ◽  
Noohul Basheer Zain Ali ◽  
Fawnizu Azmadi Hussin

Sign in / Sign up

Export Citation Format

Share Document