Train Velocity Measurement and Positioning System Based on Spatial Filter

2021 ◽  
Author(s):  
Xiaoyong Wang ◽  
Haigui Xu ◽  
Decun Dong ◽  
Dongxiu Ou
Keyword(s):  
Velocity Measurement ◽  
Spatial Filter ◽  
Positioning System

Velocity Measurement for Flow Particles by Using Spatial Filtering Technique Based on Sensor Array

2012 ◽  
Vol 508 ◽  
pp. 263-266 ◽  
Author(s):  
Zeng Xi Lu ◽  
Gang Yang ◽  
Zeng Shuang Wang
Keyword(s):  
Particle Velocity ◽  
Velocity Measurement ◽  
Sensor Array ◽  
Spatial Filtering ◽  
Spatial Filter ◽  
Capacitance Sensor ◽  
Filtering Method ◽  
Filtering Technique ◽  
Moving Particle ◽  
Particle Velocity Measurement

In comparison with cross correlative method based particle velocity measurement, the spatial filtering method for particle velocity measurement has the advantages of simplicity of the measurement system and convenience of data processing. In the paper a capacitive velocimeter, based on the spatial filtering method, is described. In this approach a capacitance sensor array has been used as a spatial filter for particle velocity measurements. Experiments were performed on a test rig and the experimental results show that the system relative error is within ±4% over a velocity range of 2-5m/s for a moving particle.

scholarly journals Analysis on Window Function of Spatial Filter for Velocity Measurement and Its Realization Method

1990 ◽  
Vol 26 (3) ◽  
pp. 243-250 ◽  
Author(s):  
Shigeki TSUCHITANI ◽  
Seikou SUZUKI ◽  
Masahiro MATSUMOTO ◽  
Akira KOBAYASHI
Keyword(s):  
Velocity Measurement ◽  
Spatial Filter ◽  
Window Function

Comparison of Deterministic and Linear Cosine Spatial Filtering of Transmission Electron Micrographs

1972 ◽  
Vol 30 ◽  
pp. 596-597
Author(s):  
David A. Ansley
Keyword(s):  
Spherical Aberration ◽  
Focal Length ◽  
Chromatic Aberration ◽  
Spatial Filter ◽  
Operating Conditions ◽  
Objective Lens ◽  
List Type ◽  
Spatial Filters ◽  
Transmission Electron ◽  
Wide Range

The coherence of the electron flux of a transmission electron microscope (TEM) limits the direct application of deconvolution techniques which have been used successfully on unmanned spacecraft programs. The theory assumes noncoherent illumination. Deconvolution of a TEM micrograph will, therefore, in general produce spurious detail rather than improved resolution.A primary goal of our research is to study the performance of several types of linear spatial filters as a function of specimen contrast, phase, and coherence. We have, therefore, developed a one-dimensional analysis and plotting program to simulate a wide 'range of operating conditions of the TEM, including adjustment of the:(1) Specimen amplitude, phase, and separation(2) Illumination wavelength, half-angle, and tilt(3) Objective lens focal length and aperture width(4) Spherical aberration, defocus, and chromatic aberration focus shift(5) Detector gamma, additive, and multiplicative noise constants(6) Type of spatial filter: linear cosine, linear sine, or deterministic

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