AlGaN/GaN HEMT temperature-dependent large-signal model thermal circuit extraction with verification through advanced thermal imaging

Author(s):  
Matthew J. Casto ◽  
Steven R. Dooley
2003 ◽  
Vol 38 (9) ◽  
pp. 1443-1450 ◽  
Author(s):  
A. Raghavan ◽  
S. Venkataraman ◽  
B. Banerjee ◽  
Youngsuk Suh ◽  
Deukhyoun Heo ◽  
...  

2011 ◽  
Vol 53 (3) ◽  
pp. 692-697 ◽  
Author(s):  
Giovanni Crupi ◽  
Antonio Raffo ◽  
Dominique M. M.-P. Schreurs ◽  
Gustavo Avolio ◽  
Valeria Vadalà ◽  
...  
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