Heterogeneous multilayer dielectric ceramics enabled by ultralow‐temperature self‐constrained sintering

2019 ◽  
Vol 103 (1) ◽  
pp. 249-257
Author(s):  
Jianyu Hao ◽  
Fang‐Zhou Yao ◽  
Qibin Yuan ◽  
Xinwei Xu ◽  
Bin Yao ◽  
...  

2018 ◽  
Vol 102 (3) ◽  
pp. 1218-1226 ◽  
Author(s):  
Huaicheng Xiang ◽  
Yang Bai ◽  
Jobin Varghese ◽  
Chunchun Li ◽  
Liang Fang ◽  
...  


2010 ◽  
Vol 4 (2) ◽  
pp. 75-80 ◽  
Author(s):  
Ahcéne Chaouchi ◽  
Sadia Kennour ◽  
Sophie D'Astorg ◽  
Sylvain Marinel ◽  
Mohamed Aliouat

ZnTiO3 compound is an attractive dielectric ceramics owing to its interesting dielectric properties in high frequency range (?r = 19, QXf = 30,000GHz, ?? ? + 120 ppm/?C). The structure, microstructure and dielectric properties of sintered ZnTiO3, with a mixture of ZnO-B2O3 glass phase and CuO oxide as sintering aids, have been investigated. For all compounds, the sintering temperature becomes 850?C due to the glass addition. It is also shown that the addition of CuO oxide allows a control of the temperature coefficient of the permittivity (??). This parameter varies from positive to negative values with increasing the CuO content. The ZnTiO3 composition sintered at 850?C with 5 wt.% ZnO-B2O3 glass phase and 2.2 wt.% CuO addition exhibits attractive dielectric properties (?r = 23, tan ? < 10-3 and a temperature coefficient of the dielectric constant near zero, ?? = 3 ppm/?C) at 1 MHz. All these properties lead this system compatible for manufacturing Ag based electrodes multilayer dielectrics devices needed for LTCC application or other multilayer dielectric components. .



1978 ◽  
Vol 39 (C6) ◽  
pp. C6-1264-C6-1269 ◽  
Author(s):  
A. J. Leggett
Keyword(s):  


2020 ◽  
pp. 51-58
Author(s):  
Aleksandr I. Kazmin ◽  
Pavel A. Fedjunin

One of the most important diagnostic problems multilayer dielectric materials and coatings is the development of methods for quantitative interpretation of the checkout results their electrophysical and geometric parameters. The results of a study of the potential informativeness of the multi-frequency radio wave method of surface electromagnetic waves during reconstruction of the electrophysical and geometric parameters of multilayer dielectric coatings are presented. The simulation model is presented that makes it possible to evaluate of the accuracy of reconstruction of the electrophysical and geometric parameters of multilayer dielectric coatings. The model takes into account the values of the electrophysical and geometric parameters of the coating, the noise level in the measurement data and the measurement bandwidth. The results of simulation and experimental investigations of reconstruction of the structure of relative permittivitties and thicknesses of single-layer and double-layer dielectric coatings with different thicknesses, with different values of the standard deviation (RMS) of the noise level in the measured attenuation coefficients of the surface slow electromagnetic wave are presented. Coatings based on the following materials were investigated: polymethyl methacrylate, F-4D PTFE, RO3010. The accuracy of reconstruction of the electrophysical parameters of the layers decreases with an increase in the number of evaluated parameters and an increase in the noise level. The accuracy of the estimates of the electrophysical parameters of the layers also decreases with a decrease in their relative permittivity and thickness. The results of experimental studies confirm the adequacy of the developed simulation model. The presented model allows for a specific measuring complex that implements the multi-frequency radio wave method of surface electromagnetic waves, to quantify the potential possibilities for the accuracy of reconstruction of the electrophysical and geometric parameters of multilayer dielectric materials and coatings. Experimental investigations and simulation results of a multilayer dielectric coating demonstrated the theoretical capabilities gained relative error permittivity and thickness of the individual layers with relative error not greater than 10 %, with a measurement bandwidth of 1 GHz and RMS of noise level 0,003–0,004.





2010 ◽  
Vol 25 (3) ◽  
pp. 332-336
Author(s):  
Zheng-Dong LU ◽  
Chun-Ying SHEN ◽  
Liang LI ◽  
Jian YANG ◽  
Tai QIU


1988 ◽  
Author(s):  
K. D. McHenry ◽  
B. G. Koepke


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