Characterization of molecular nitrogen in III-V compound semiconductors by near-edge x-ray absorption fine structure and photoemission spectroscopies

Structural characterization of the zinc site in Escherichia coliL-threonine dehydrogenase using extended X-ray absorption fine structure spectroscopy

Inorganica Chimica Acta ◽

10.1016/s0020-1693(97)06107-0 ◽

1998 ◽

Vol 275-276 ◽

pp. 215-221 ◽

Author(s):

Kimber Clark-Baldwin ◽

Adam R. Johnson ◽

Yen-Wen Chen ◽

Eugene E. Dekker ◽

James E. Penner-Hahn

Keyword(s):

Fine Structure ◽

Structural Characterization ◽

X Ray ◽

Threonine Dehydrogenase ◽

Absorption Fine ◽

X Ray Absorption ◽

Zinc Site

Chloride Complexation of Zr and Hf in HCl Investigated by Extended X-ray Absorption Fine Structure Spectroscopy: Toward Characterization of Chloride Complexation of Element 104, Rutherfordium (Rf)

Bulletin of the Chemical Society of Japan ◽

10.1246/bcsj.82.698 ◽

2009 ◽

Vol 82 (6) ◽

pp. 698-703 ◽

Cited By ~ 11

Author(s):

Hiromitsu Haba ◽

Kazuhiko Akiyama ◽

Kazuaki Tsukada ◽

Masato Asai ◽

Atsushi Toyoshima ◽

...

Keyword(s):

Fine Structure ◽

X Ray ◽

Absorption Fine ◽

Characterization of Reaction of Green Rust with Foreign Ions using X-ray Absorption Fine Structure

Zairyo-to-Kankyo ◽

10.3323/jcorr.57.353 ◽

2008 ◽

Vol 57 (8) ◽

pp. 353-357 ◽

Author(s):

Shigeru Suzuki ◽

Kozo Shinoda ◽

Masugu Sato ◽

Shinji Fujimoto ◽

Masato Yamashita ◽

...

Keyword(s):

Fine Structure ◽

Green Rust ◽

X Ray ◽

Foreign Ions ◽

Absorption Fine ◽

Characterization of Protein Immobilization at Silver Surfaces by Near Edge X-ray Absorption Fine Structure Spectroscopy

Langmuir ◽

10.1021/la060988w ◽

2006 ◽

Vol 22 (18) ◽

pp. 7719-7725 ◽

Cited By ~ 22

Author(s):

Xiaosong Liu ◽

Chang-Hyun Jang ◽

Fan Zheng ◽

Astrid Jürgensen ◽

J. D. Denlinger ◽

...

Keyword(s):

Fine Structure ◽

Protein Immobilization ◽

X Ray ◽

Absorption Fine ◽

X Ray Absorption ◽

Silver Surfaces

Characterization of TcCl4 and β-TcCl3 by X-ray absorption fine structure spectroscopy

Journal of Radioanalytical and Nuclear Chemistry ◽

10.1007/s10967-013-2743-0 ◽

2013 ◽

Vol 299 (1) ◽

pp. 235-239 ◽

Author(s):

Frederic Poineau ◽

Erik V. Johnstone ◽

Alfred P. Sattelberger ◽

Kenneth R. Czerwinski

Keyword(s):

Fine Structure ◽

X Ray ◽

Absorption Fine ◽

Raman spectra and extended X-ray absorption fine structure characterization of La(2−x)/3NaxTiO3 and Nd(2−x)/3LixTiO3 microwave ceramics

Journal of the European Ceramic Society ◽

10.1016/j.jeurceramsoc.2009.07.024 ◽

2010 ◽

Vol 30 (2) ◽

pp. 335-339 ◽

Cited By ~ 9

Author(s):

Mei-Yu Chen ◽

Ching Yu Chiu ◽

Chia-Ta Chia ◽

J.F. Lee ◽

J.J. Bian

Keyword(s):

Fine Structure ◽

Raman Spectra ◽

Structure Characterization ◽

Microwave Ceramics ◽

X Ray ◽

Absorption Fine ◽

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

Characterization of the Si/GaAs(110) interface by soft x-ray surface x-ray absorption fine structure

10.1116/1.587988 ◽

1995 ◽

Vol 13 (1) ◽

pp. 69 ◽

Author(s):

M. L. Hasnaoui

Keyword(s):

Fine Structure ◽

X Ray ◽

Absorption Fine ◽

Characterization of a split axial-oxygen site inTlBa2Ca3Cu4O11by extended x-ray-absorption fine-structure spectroscopy

Physical Review B ◽

10.1103/physrevb.44.9480 ◽

1991 ◽

Vol 44 (17) ◽

pp. 9480-9485 ◽

Cited By ~ 33

Author(s):

P. G. Allen ◽

J. Mustre de Leon ◽

S. D. Conradson ◽

A. R. Bishop

Keyword(s):

Fine Structure ◽

X Ray ◽

Absorption Fine ◽

X Ray Absorption ◽

Oxygen Site

Characterization of highly dispersed cobalt sulfide catalysts by X-ray absorption fine structure and magnetic properties

Applied Catalysis A General ◽

10.1016/j.apcata.2006.06.040 ◽

2006 ◽

Vol 312 ◽

pp. 125-133 ◽

Cited By ~ 11

Author(s):

T KADONO ◽

T KUBOTA ◽

I HIROMITSU ◽

Y OKAMOTO

Keyword(s):

Magnetic Properties ◽

Fine Structure ◽

Cobalt Sulfide ◽

Sulfide Catalysts ◽

X Ray ◽

Absorption Fine ◽

Highly Dispersed ◽

Characterisation of nitrogen-related defects in compound semiconductors by near-edge x-ray absorption fine structure

2008 Conference on Optoelectronic and Microelectronic Materials and Devices ◽

10.1109/commad.2008.4802100 ◽

2008 ◽

Cited By ~ 1

Author(s):

Mladen Petravic ◽

Zlatko Majlinger ◽

Ana Bozanic ◽

Yaw-Wen Yang ◽

Michael Gao ◽

...

Keyword(s):

Fine Structure ◽

Compound Semiconductors ◽

X Ray ◽

Absorption Fine ◽