Characterization of TcCl4 and β-TcCl3 by X-ray absorption fine structure spectroscopy
2013 ◽
Vol 299
(1)
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pp. 235-239
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2009 ◽
Vol 82
(6)
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pp. 698-703
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Characterization of the Si/GaAs(110) interface by soft x-ray surface x-ray absorption fine structure
1995 ◽
Vol 13
(1)
◽
pp. 69
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