Error analysis of angular resolution for direct intercepting measurement laser warning equipment

AbstractA widely used tool in studying quasi-monoperiodic processes is the O–C diagram. This paper deals with the application of this diagram in minor planet studies. The main difference between our approach and the classical O–C diagram is that we transform the epoch (=time) dependence into the geocentric longitude domain. We outline a rotation modelling using this modified O–C and illustrate the abilities with detailed error analysis. The primary assumption, that the monotonity and the shape of this diagram is (almost) independent of the geometry of the asteroids is discussed and tested. The monotonity enables an unambiguous distinction between the prograde and retrograde rotation, thus the four-fold (or in some cases the two-fold) ambiguities can be avoided. This turned out to be the main advantage of the O–C examination. As an extension to the theoretical work, we present some preliminary results on 1727 Mette based on new CCD observations.

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Small-Angle Electron Scattering (SAES) of Polymers

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100117467 ◽

1985 ◽

Vol 43 ◽

pp. 78-79

Author(s):

Ralph Oralor ◽

Pamela Lloyd ◽

Satish Kumar ◽

W. W. Adams

Keyword(s):

Electron Scattering ◽

Small Angle ◽

Angular Resolution ◽

Structural Features ◽

Objective Lens ◽

High Angular Resolution ◽

Push Button ◽

First Case ◽

Diffraction Mode ◽

Very High

Small angle electron scattering (SAES) has been used to study structural features of up to several thousand angstroms in polymers, as well as in metals. SAES may be done either in (a) long camera mode by switching off the objective lens current or in (b) selected area diffraction mode. In the first case very high camera lengths (up to 7Ø meters on JEOL 1Ø ØCX) and high angular resolution can be obtained, while in the second case smaller camera lengths (approximately up to 3.6 meters on JEOL 1Ø ØCX) and lower angular resolution is obtainable. We conducted our SAES studies on JEOL 1ØØCX which can be switched to either mode with a push button as a standard feature.

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Large-angle convergent-beam electron-diffraction study of coherent precipitates and decorated dislocations

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100167470 ◽

1996 ◽

Vol 54 ◽

pp. 1002-1004

Author(s):

J.M.K. Wiezorek ◽

H.L. Fraser

Keyword(s):

Electron Diffraction ◽

Angular Resolution ◽

Large Angle ◽

Electron Diffraction Study ◽

Convergent Beam Electron Diffraction ◽

Crystal Defects ◽

High Angular Resolution ◽

Beam Electron ◽

Diffraction Plane ◽

Convergent Beam

Conventional methods of convergent beam electron diffraction (CBED) use a fully converged probe focused on the specimen in the object plane resulting in the formation of a CBED pattern in the diffraction plane. Large angle CBED (LACBED) uses a converged but defocused probe resulting in the formation of ‘shadow images’ of the illuminated sample area in the diffraction plane. Hence, low-spatial resolution image information and high-angular resolution diffraction information are superimposed in LACBED patterns which enables the simultaneous observation of crystal defects and their effect on the diffraction pattern. In recent years LACBED has been used successfully for the investigation of a variety of crystal defects, such as stacking faults, interfaces and dislocations. In this paper the contrast from coherent precipitates and decorated dislocations in LACBED patterns has been investigated. Computer simulated LACBED contrast from decorated dislocations and coherent precipitates is compared with experimental observations.

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Error Analysis in Neuropsychological Assessment of Verbal Memory and Learning

European Journal of Psychological Assessment ◽

10.1027/1015-5759.11.1.21 ◽

1995 ◽

Vol 11 (1) ◽

pp. 21-28 ◽

Cited By ~ 5

Author(s):

Dietmar Heubrock

Keyword(s):

Error Analysis ◽

Verbal Memory ◽

Verbal Learning ◽

Learning Disorders ◽

Memory And Learning ◽

Auditory Verbal Learning Test ◽

Additional Information ◽

Auditory Verbal Learning ◽

Accurate Picture ◽

Learning Test

Performance on a German version of the Rey Auditory-Verbal Learning Test (AVLT) was investigated for 64 juvenile patients who were subdivided in 6 clinical groups. In addition to standard evaluation of AVLT protocols which is usually confined to items recalled correctly, an error analysis was performed. Differentiating between total errors (TE), repetition errors (RE), and misnamings (ME), substantial differences between clinical groups could be demonstrated. It is argued that error analysis of verbal memory and learning enriches the understanding of neuropsychological syndromes, and provides additional information for diagnostic and clinical use. Thus, it is possible to gain a more accurate picture so that patients can be appropriately retrained, and research into the functional causes of memory and learning disorders can be intensified.

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