A low-coherence interferometer system for simultaneous measurement of refractive index and thickness ranging from 20 um to a few millimeters

Author(s):  
S. Inoue
1997 ◽  
Vol 4 (4) ◽  
pp. 507-515 ◽  
Author(s):  
Masato Ohmi ◽  
Takehisa Shiraishi ◽  
Hideyuki Tajiri ◽  
Masamitsu Haruna

2002 ◽  
Vol 41 (7) ◽  
pp. 1315 ◽  
Author(s):  
Hideki Maruyama ◽  
Shogo Inoue ◽  
Teruki Mitsuyama ◽  
Masato Ohmi ◽  
Masamitsu Haruna

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