A low-coherence interferometer system for simultaneous measurement of refractive index and thickness ranging from 20 um to a few millimeters
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Keyword(s):
2000 ◽
Vol 47
(9)
◽
pp. 1266-1270
◽
2004 ◽
Vol 15
(8)
◽
pp. 1531-1535
◽
Keyword(s):
Keyword(s):