Linear off null working condition for total internal reflection imaging ellipsometry to detect subtle electron density change
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2011 ◽
Vol 159
(1)
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pp. 121-125
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2020 ◽
Vol 38
(2)
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pp. 024001
2007 ◽
Vol 4
(1/2)
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pp. 171
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2014 ◽
Vol 190
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pp. 221-226
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