scholarly journals Linear off null working condition for total internal reflection imaging ellipsometry to detect subtle electron density change

Author(s):  
Xiangnan Jin ◽  
Chenyu Wang ◽  
Jia Shen ◽  
Wei Liu ◽  
Ziren Luo ◽  
...  
2011 ◽  
Vol 519 (9) ◽  
pp. 2758-2762 ◽  
Author(s):  
Li Liu ◽  
Yan-yan Chen ◽  
Yong-hong Meng ◽  
She Chen ◽  
Gang Jin

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