Efficiency calibration of NaI (Tl) detector for disc source using point source experimental technique and Monte Carlo simulations

Author(s):  
Azhar Hussain Malik ◽  
Muhammad Rizwan ◽  
Rizwan Ahmed

2000 ◽  
Vol 37 (12) ◽  
pp. 1075-1081 ◽  
Author(s):  
Jun SAEGUSA ◽  
Tetsuya OISHI ◽  
Katsuya KAWASAKI ◽  
Michio YOSHIZAWA ◽  
Makoto YOSHIDA ◽  
...  


2008 ◽  
Vol 35 (6Part12) ◽  
pp. 2780-2780
Author(s):  
Y Zhai ◽  
L Trache ◽  
R Tribble ◽  
Y Liu ◽  
C Shi ◽  
...  




2016 ◽  
Vol 164 ◽  
pp. 47-59 ◽  
Author(s):  
E.G. Androulakaki ◽  
C. Tsabaris ◽  
G. Eleftheriou ◽  
M. Kokkoris ◽  
D.L. Patiris ◽  
...  


Author(s):  
Matthew T. Johnson ◽  
Ian M. Anderson ◽  
Jim Bentley ◽  
C. Barry Carter

Energy-dispersive X-ray spectrometry (EDS) performed at low (≤ 5 kV) accelerating voltages in the SEM has the potential for providing quantitative microanalytical information with a spatial resolution of ∼100 nm. In the present work, EDS analyses were performed on magnesium ferrite spinel [(MgxFe1−x)Fe2O4] dendrites embedded in a MgO matrix, as shown in Fig. 1. spatial resolution of X-ray microanalysis at conventional accelerating voltages is insufficient for the quantitative analysis of these dendrites, which have widths of the order of a few hundred nanometers, without deconvolution of contributions from the MgO matrix. However, Monte Carlo simulations indicate that the interaction volume for MgFe2O4 is ∼150 nm at 3 kV accelerating voltage and therefore sufficient to analyze the dendrites without matrix contributions.Single-crystal {001}-oriented MgO was reacted with hematite (Fe2O3) powder for 6 h at 1450°C in air and furnace cooled. The specimen was then cleaved to expose a clean cross-section suitable for microanalysis.



1993 ◽  
Vol 3 (9) ◽  
pp. 1713-1718 ◽  
Author(s):  
P. Dollfus ◽  
S. Galdin ◽  
C. Brisset ◽  
P. Hesto


1979 ◽  
Vol 40 (C7) ◽  
pp. C7-63-C7-64
Author(s):  
A. J. Davies ◽  
J. Dutton ◽  
C. J. Evans ◽  
A. Goodings ◽  
P.K. Stewart


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