A review on barrier diffraction theories and related insertion loss comparisons in highway noise models

2006 ◽  
Vol 120 (5) ◽  
pp. 3337-3337
Author(s):  
Ning Shu ◽  
Louis F. Cohn ◽  
Roswell A. Harris ◽  
Teak K. Kim
Keyword(s):  
Insertion Loss ◽  
Highway Noise ◽  
Noise Models

Variability of highway noise barrier insertion loss in the atmosphere

1998 ◽  
Vol 104 (3) ◽  
pp. 1750-1750
Author(s):  
Scott D. Hansen ◽  
Courtney B. Burroughs
Keyword(s):  
Insertion Loss ◽  
Noise Barrier ◽  
Highway Noise

A model for insertion loss degradation for parallel highway noise barriers

1986 ◽  
Vol 80 (3) ◽  
pp. 855-868 ◽  
Author(s):  
William Bowlby ◽  
Louis F. Cohn
Keyword(s):  
Insertion Loss ◽  
Noise Barriers ◽  
Highway Noise

A Review of Studies of Insertion Loss Degradation for Parallel Highway Noise Barriers

1987 ◽  
Vol 28 (2) ◽  
pp. 40 ◽  
Author(s):  
William Bowlby ◽  
Louis F. Cohn ◽  
R. A. Harris
Keyword(s):  
Insertion Loss ◽  
Noise Barriers ◽  
Highway Noise

A case for simple highway‐noise models

1976 ◽  
Vol 59 (S1) ◽  
pp. S80-S80
Author(s):  
Kenneth J. Plotkin
Keyword(s):  
Highway Noise ◽  
Noise Models

Quantum noise models for semiconductor lasers: is there a missing noise source?

1997 ◽  
Vol 44 (10) ◽  
pp. 1929-1936 ◽  
Author(s):  
A. BRAMATI, V. JOST, F. MARIN and E. G
Keyword(s):  
Semiconductor Lasers ◽  
Quantum Noise ◽  
Noise Source ◽  
Noise Models

Method for Evaluating Insertion Loss of EMI Filter Connected to Semiconductor Power Converters

2012 ◽  
Vol 132 (7) ◽  
pp. 727-735 ◽  
Author(s):  
Michio Tamate ◽  
Tamiko Sasaki ◽  
Akio Toba ◽  
Yasushi Matsumoto ◽  
Keiji Wada ◽  
...  
Keyword(s):  
Insertion Loss ◽  
Power Converters ◽  
Emi Filter

Performance and Reliability of a MEMS-based tunable optical filter operating in the 1565 nm-1525 nm wavelength range

2002 ◽  
Vol 722 ◽  
Author(s):  
T. S. Sriram ◽  
B. Strauss ◽  
S. Pappas ◽  
A. Baliga ◽  
A. Jean ◽  
...  
Keyword(s):  
Silicon Nitride ◽  
Line Width ◽  
Insertion Loss ◽  
Optical Filter ◽  
Single Mode ◽  
Single Mode Fiber ◽  
Reliability Testing ◽  
Silicon Nitride Membrane ◽  
Tunable Optical Filter ◽  
Extensive Performance

AbstractThis paper describes the results of extensive performance and reliability characterization of a silicon-based surface micro-machined tunable optical filter. The device comprises a high-finesse Fabry-Perot etalon with one flat and one curved dielectric mirror. The curved mirror is mounted on an electrostatically actuated silicon nitride membrane tethered to the substrate using silicon nitride posts. A voltage applied to the membrane allows the device to be tuned by adjusting the length of the cavity. The device is coupled optically to an input and an output single mode fiber inside a hermetic package. Extensive performance characterization (over operating temperature range) was performed on the packaged device. Parameters characterized included tuning characteristics, insertion loss, filter line-width and side mode suppression ratio. Reliability testing was performed by subjecting the MEMS structure to a very large number of actuations at an elevated temperature both inside the package and on a test board. The MEMS structure was found to be extremely robust, running trillions of actuations without failures. Package level reliability testing conforming to Telcordia standards indicated that key device parameters including insertion loss, filter line-width and tuning characteristics did not change measurably over the duration of the test.

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