Thermionic field emission of electrons from metals and explosive electron emission from micropoints

2009 ◽  
Vol 109 (2) ◽  
pp. 314-321 ◽  
Author(s):  
A. B. Petrin
1983 ◽  
Vol 139 (2) ◽  
pp. 265 ◽  
Author(s):  
E.A. Litvinov ◽  
Gennadii A. Mesyats ◽  
D.I. Proskurovskii

2000 ◽  
Vol 621 ◽  
Author(s):  
F.A.M. Köck ◽  
J.M. Garguilo ◽  
B. Brown ◽  
R.J. Nemanich

ABSTRACTImaging of field emission and photoemission from diamond surfaces is accomplished with a high resolution photo-electron emission microscope (PEEM). Measurements obtained as a function of sample temperature up to 1000°C display thermionic field emission images (TFEEM). The system can also record the emission current versus applied voltage. N-doped diamond films have been produced by MPCVD with a N/C gas phase ratio of 48. The surfaces display uniform emission in PEEM at all temperatures. No FEEM images are detectable below 500°C. At ∼680°C the T-FEEM and PEEM images are nearly identical in intensity and uniformity. This is to be contrasted with other carbon based cold cathodes in which the emission is observed from only a low density of highly emitting sites. The I/V measurements obtained from the N-doped films in the T-FEEM configuration show a component that depends linearly on voltage at low fields. At higher fields, an approximately exponential dependence is observed. At low temperatures employed (<700°C), the results indicate a thermionic component to the emitted current.


1983 ◽  
Vol 26 (2) ◽  
pp. 138-159 ◽  
Author(s):  
E A Litvinov ◽  
Gennadii A Mesyats ◽  
D I Proskurovskiĭ

2013 ◽  
Vol 25 (5) ◽  
pp. 1236-1240 ◽  
Author(s):  
左应红 Zuo Yinghong ◽  
王建国 Wang Jianguo ◽  
范如玉 Fan Ruyu ◽  
朱金辉 Zhu Jinhui ◽  
牛胜利 Niu Shengli

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