Determination of the composition and stresses in GexSi(1−x) heterostructures from Raman spectroscopy data: Refinement of model parameters

2006 ◽  
Vol 40 (11) ◽  
pp. 1314-1320 ◽  
Author(s):  
V. A. Volodin ◽  
M. D. Efremov ◽  
A. S. Deryabin ◽  
L. V. Sokolov
Keyword(s):  
Raman Spectroscopy ◽  
Model Parameters ◽  
Spectroscopy Data ◽  
Data Refinement ◽  
Raman Spectroscopy Data

Determination of the composition and strains in GexSi1−x -based nanostructures from Raman spectroscopy data with consideration of the contribution of the heterointerface

2007 ◽  
Vol 41 (8) ◽  
pp. 930-934 ◽  
Author(s):  
V. A. Volodin ◽  
M. D. Efremov ◽  
A. I. Yakimov ◽  
G. Yu. Mikhalev ◽  
A. I. Nikiforov ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Spectroscopy Data ◽  
Raman Spectroscopy Data
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