A Simple Numerical Method for Determining the Energy Spectrum of Charge Carriers in Semiconductor Heterostructures

2018 ◽  
Vol 44 (3) ◽  
pp. 232-234 ◽  
Author(s):  
G. F. Glinskii
Author(s):  
Г.Ф. Глинский

AbstractA simple numerical method for determining the energy spectrum and wave functions of charge carriers in semiconductor heterostructures (quantum wells, wires, dots, and superlattices) is proposed that employs the effective mass approximation in the general case of multiband kp Hamiltonian corresponding to the Γ point of the Brillouin zone. The method is based on the Fourier transform for structures with periodic potential. For single heterostructures, this periodicity is introduced artificially. In the framework of the proposed approach, the effective matrix Hamiltonian of a heterostructure can be written in two unitarily-equivalent a - and k -representations. As an example, single-band kp models of a heterostructure with one parabolic, triangular, or rectangular quantum well are considered and the influence of interfacial kp corrections on the behavior of envelope functions at sharp heteroboundaries is studied.


2008 ◽  
Vol 42 (12) ◽  
pp. 1383-1387 ◽  
Author(s):  
S. A. Aliyev ◽  
Z. F. Agayev ◽  
R. I. Selimzadeh

2011 ◽  
Vol 47 (8) ◽  
pp. 853-857 ◽  
Author(s):  
F. F. Aliev ◽  
H. A. Hasanov

2002 ◽  
Vol 28 (8) ◽  
pp. 693-695
Author(s):  
G. G. Zegrya ◽  
O. V. Konstantinov ◽  
A. V. Matveentsev

Author(s):  
А.С. Пузанов ◽  
С.В. Оболенский ◽  
В.А. Козлов

Based on the Monte Carlo algorithm, a method has been developed for calculating the energy spectrum of hot nonequilibrium electrons and holes in the track of the primary recoil atom when exposed to single fast neutrons. The calculations of the heating and subsequent relaxation of nonequilibrium charge carriers in silicon in the track of a charged particle with initial energies in the range of 50...200 keV are carried out. The characteristic temperatures of the electron and hole plasma were obtained, which amounted to 5400 K and 2700 K, respectively. The effect of radiation-induced heating of charge carriers on the failure stability of static memory elements is discussed.


1970 ◽  
Vol 3 (2) ◽  
pp. 309-314 ◽  
Author(s):  
B. T. Kolomiets ◽  
T. N. Mamontova ◽  
G. I. Stepanov

Author(s):  
A. A. Bloshkin ◽  
A. I. Yakimov ◽  
A. F. Zinovieva ◽  
V. A. Zinoviev ◽  
A. V. Dvurechenskii

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