Application of the Scattering Matrix Method for Calculation of Impurity States in Semiconductor Structures

Author(s):  
S. V. Morozov ◽  
M. S. Zholudev
2006 ◽  
Vol 18 (24) ◽  
pp. 2605-2607 ◽  
Author(s):  
Q. Y. Lu ◽  
W. H. Guo ◽  
R. Phelan ◽  
D. Byrne ◽  
J. F. Donegan ◽  
...  

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