Electron microscopy characterization of higher manganese silicide film structure on silicon
2016 ◽
Vol 11
(9-10)
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pp. 610-616
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2009 ◽
1988 ◽
Vol 17
(5)
◽
pp. 373-380
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2018 ◽
Vol 165
(11)
◽
pp. D536-D542
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2008 ◽
Vol 47
(7)
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pp. 5330-5332
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