Relative Information Capacity of Simple Relational Database Schemata

1986 ◽  
Vol 15 (3) ◽  
pp. 856-886 ◽  
Author(s):  
Richard Hull
2020 ◽  
Vol 14 (01) ◽  
pp. 27-53
Author(s):  
Nonyelum Ndefo ◽  
Enrico Franconi

The problem of determining the relative information capacity between two knowledge bases or schemas, of the same or different models, is inherent when implementing schema transformations. When restructuring one schema into another, one expects that the schema transformation supports the complete and correct mapping of all the information contents from the source schema to the target schema. Such a characteristic is commonly referred to as information capacity preservation or schema dominance. This paper presents a formal and constructive approach to measure the relative information capacity, in the restricted case of first-order schemas related by first-order mappings. It complements the existing definitions of information capacity preservation from the perspective of model theory, showing the exact relationships among the constraints of the involved schemas, the mappings between the components of these schemas, and the database states which the schemas admit. Since satisfying some sort of schema equivalence property is essential in areas such as database conceptual design and database reverse engineering, our approach allows us to characterize the notion of normalization in database design. We review the current literature concerning database normal forms and decompositions. We also review the process of reverse engineering a database schema. In addition, we provide deeper insight into database reverse engineering methodologies, suggesting horizontal decompositions as a useful tool for facilitating the discovery of more specific objects and relationships in the conceptualization phase of the process. With the aid of simple examples, we show the essence behind our reasoning. We discuss the need for an unambiguous means through which objects in the output schema can be identified. Ultimately, the knowledge this paper ensues will be beneficial to database engineers in performing a correct schema transformation.


1982 ◽  
Vol 19 (3) ◽  
pp. 267-285 ◽  
Author(s):  
Paolo Atzeni ◽  
Giorgio Ausiello ◽  
Carlo Batini ◽  
Marina Moscarini

1981 ◽  
Vol 6 (1) ◽  
pp. 1-47 ◽  
Author(s):  
Carlo Zaniolo ◽  
Miachel A. Meklanoff

Author(s):  
D. C. Joy ◽  
R. D. Bunn

The information available from an SEM image is limited both by the inherent signal to noise ratio that characterizes the image and as a result of the transformations that it may undergo as it is passed through the amplifying circuits of the instrument. In applications such as Critical Dimension Metrology it is necessary to be able to quantify these limitations in order to be able to assess the likely precision of any measurement made with the microscope.The information capacity of an SEM signal, defined as the minimum number of bits needed to encode the output signal, depends on the signal to noise ratio of the image - which in turn depends on the probe size and source brightness and acquisition time per pixel - and on the efficiency of the specimen in producing the signal that is being observed. A detailed analysis of the secondary electron case shows that the information capacity C (bits/pixel) of the SEM signal channel could be written as :


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