Progress and research at the Shanghai EBIT
Keyword(s):
X Ray
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In this report, a brief description of the current progress at the Shanghai EBIT project is presented. This is followed by a short discussion of the measurement of various parameters (electron beam diameter and ion density) under a number of operational conditions. A brief introduction to di-electronic recombination measurements for highly ionized xenon is given. Next, we present a preliminary measurement of the time dependence of xenon X-ray emission lines. Finally, a comparison of calculated and experimental charge-state distributions is given. This shows the influence of multi-electron capture and different distributions of the ion cloud on the charge state distribution.PACS Nos.: 41.85.–p; 34.80.Kw; 34.80Lx
2000 ◽
Vol 160
(2)
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pp. 290-300
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1979 ◽
Vol 291
(2)
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pp. 117-128
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