EFFECTS OF A MAGNETIC FIELD ON THE MICROWAVE SURFACE IMPEDANCE OF Bi2Sr2CaCu2O8-x SINGLE CRYSTALS

2003 ◽  
Vol 17 (04n06) ◽  
pp. 922-928
Author(s):  
E. SILVA ◽  
R. ROGAI ◽  
R. MARCON ◽  
S. SARTI ◽  
R. FASTAMPA ◽  
...  

We present measurements of the field-induced change of the microwave surface impedance in optimally doped Bi 2 Sr 2 CaCu 2 O 8-x crystals. Measurements are taken with microwave fields in the (a,b) planes. A moderate (< 0.7 T) dc magnetic field is applied normal to the (a,b) planes. Measurements are taken for temperatures above 70 K. At fixed temperature, with increasing field the surface resistance presents a sharp onset at low fields, a steep rise then a plateau or a peak, followed by a second, slower rise with the field. The surface reactance presents similarly a steep raise at low fields above the onset, then a sudden decrease. We discuss the applicability of commonly established vortex motion models to the observed response, and we find that substantial inconsistencies emerge. Possible influences of the layered nature on the vortex response are investigated.

1992 ◽  
Vol 275 ◽  
Author(s):  
H. Jiang ◽  
H. How ◽  
A. Widom ◽  
C. Vittoria

ABSTRACTWe used a microwave technique in which a small strip of YBCO film is induced to self-resonant in order to measure the surface impedance at 21 GHz. Both the amplitude and phase of the transmission coefficient, S21, as a function of frequency was measured at different temperatures. The surface resistance, Rs, was obtained from at resonant frequency, where Z0is the waveguide impedance. The surface reactance, Xa was obtained from the measurement of frequency shift with temperature. We found that Ra changed about 3 orders of magnitude as T decreased from 90K to 80K reaching a low value of 4.9 × 10−4μ. From Ra and Xa we deduced the London penetration depth to be λ ∼ 1800Å at 4K and 8000Å at 86.5K.


2009 ◽  
Vol 19 (3) ◽  
pp. 2917-2920 ◽  
Author(s):  
N. Pompeo ◽  
R. Rogai ◽  
V. Galluzzi ◽  
A. Augieri ◽  
G. Celentano ◽  
...  

1993 ◽  
Vol 3 (1) ◽  
pp. 1432-1434 ◽  
Author(s):  
J. Wosik ◽  
L.M. Xie ◽  
J. Halbritter ◽  
R. Chau ◽  
A. Samaan ◽  
...  

2005 ◽  
Vol 15 (2) ◽  
pp. 3692-3695 ◽  
Author(s):  
A. Saito ◽  
M. Shirakawa ◽  
K. Kitamura ◽  
Y. Noguchi ◽  
M. Mukaida ◽  
...  

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