On the Determination of Minority Carrier Lifetime and Surface Recombination Velocity from the Transient Response of MOS Capacitors
1972 ◽
Vol 11
(8)
◽
pp. 1161-1164
◽
1977 ◽
Vol 24
(9)
◽
pp. 1172-1177
◽
1991 ◽
Vol 38
(9)
◽
pp. 2169-2180
◽