Electron Impact Mass Spectrometric Study of Vacuum-Deposited Nickel and Gold Films on Silicon Substrates
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2002 ◽
Vol 2002
(7)
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pp. 321-325
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1980 ◽
Vol 35
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pp. 231-242
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1961 ◽
Vol 34
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pp. 1864-1871
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pp. 614-624
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1998 ◽
Vol 12
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pp. 1845-1858
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Vol 128
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pp. 193-202
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pp. 614-619
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1991 ◽
Vol 26
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pp. 972-976
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