Photo-Induced Current Transient Spectroscopy in High-Resistivity Bulk Material. III. Scanning-PICTS System for Imaging Spatial Distributions of Deep-Traps in Semi-Insulating GaAs Wafer

1985 ◽  
Vol 24 (Part 1, No. 4) ◽  
pp. 431-440 ◽  
Author(s):  
Osamu Yoshie ◽  
Mitsuo Kamihara
Keyword(s):  
Bulk Material ◽  
Current Transient ◽  
High Resistivity ◽  
Spatial Distributions ◽  
Induced Current ◽  
Gaas Wafer ◽  
Deep Traps ◽  
Transient Spectroscopy

scholarly journals Photo-Induced Current Transient Spectroscopy of Semi-insulating Single Crystal Cs2Hg6S7

2014 ◽  
Vol 44 (1) ◽  
pp. 222-226 ◽  
Author(s):  
Z. Liu ◽  
J.A. Peters ◽  
H. Li ◽  
M. G. Kanatzidis ◽  
J. Im ◽  
...  
Keyword(s):  
Single Crystal ◽  
Current Transient ◽  
Induced Current ◽  
Transient Spectroscopy
Sign in / Sign up

Export Citation Format

Share Document