Application of UV-Raman Spectroscopy for Characterization of the Physical Crystal Structure Following Flash Anneal of an Ultrashallow Implanted Layer

2006 ◽  
Vol 153 (7) ◽  
pp. G697 ◽  
Author(s):  
Masahiro Yoshimoto ◽  
Hiroshi Nishigaki ◽  
Hiroshi Harima ◽  
Toshiyuki Isshiki ◽  
Kitaek Kang ◽  
...  

2004 ◽  
Vol 96 (1/2) ◽  
pp. 1-4 ◽  
Author(s):  
B.L. Mojet ◽  
L. Coulier ◽  
J. van Grondelle ◽  
J.W. Niemantsverdriet ◽  
R.A. van Santen


2008 ◽  
Vol 10 (45) ◽  
pp. 6770 ◽  
Author(s):  
S. K. Srivastava ◽  
S. Niebling ◽  
B. Küstner ◽  
P. R. Wich ◽  
C. Schmuck ◽  
...  


2015 ◽  
Vol 113 ◽  
pp. 402-411 ◽  
Author(s):  
Y. Elmay ◽  
Y. Le Brech ◽  
L. Delmotte ◽  
A. Dufour ◽  
N. Brosse ◽  
...  


2002 ◽  
Vol 31 (11) ◽  
pp. 1152-1153 ◽  
Author(s):  
Ye Wang ◽  
Qinghong Zhang ◽  
Qian Guo ◽  
Tong Chen ◽  
Huilin Wan ◽  
...  


1998 ◽  
Vol 509 ◽  
Author(s):  
Z. Li Tolt ◽  
R. L. Fink ◽  
Zvi Yaniv

AbstractCarbon thin film cathodes have been produced with an emission site density of 2 × 105/cm2 and with current density higher than 40 mA/cm2at 10 V/μm extraction field. Characterization of the film bonding structure by UV Raman spectroscopy and emission sites by Atomic Force Microscopy (AFM) are presented and discussed in detail. A hypothesis of the nature of emission sites in these films is proposed in accordance with the analyses.



2001 ◽  
Vol 46 (1) ◽  
pp. 23-34 ◽  
Author(s):  
Yi Yu ◽  
Guang Xiong ◽  
Can Li ◽  
Feng-Shou Xiao


LWT ◽  
2015 ◽  
Vol 64 (1) ◽  
pp. 56-60 ◽  
Author(s):  
Rasha M. El-Abassy ◽  
Bernd von der Kammer ◽  
Arnulf Materny


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