(Invited) Two-Dimensional Characterization of Wide-Bandgap Materials and Contact Interfaces by Using Scanning Internal Photoemission Microscopy

2021 ◽  
Vol 104 (4) ◽  
pp. 69-82
Author(s):  
Kenji Shiojima
Keyword(s):  
Wide Bandgap ◽  
Two Dimensional ◽  
Internal Photoemission ◽  
Wide Bandgap Materials ◽  
Bandgap Materials

Two-dimensional characterization of ion-implantation damage in GaN Schottky contacts using scanning internal photoemission microscopy

2016 ◽  
Vol 55 (4S) ◽  
pp. 04EG05 ◽  
Author(s):  
Kenji Shiojima ◽  
Shingo Murase ◽  
Shingo Yamamoto ◽  
Tomoyoshi Mishima ◽  
Tohru Nakamura
Keyword(s):  
Ion Implantation ◽  
Schottky Contacts ◽  
Two Dimensional ◽  
Internal Photoemission ◽  
Implantation Damage
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