Bismuth Thin Films: Growth, Structure and Properties

2012 ◽  
Keyword(s):  
Thin Films ◽  
Structure And Properties ◽  
Growth Structure

Growth, structure and properties of sputtered niobium oxide thin films

2011 ◽  
Vol 519 (10) ◽  
pp. 3068-3073 ◽  
Author(s):  
Ali Foroughi-Abari ◽  
Kenneth C. Cadien
Keyword(s):  
Thin Films ◽  
Niobium Oxide ◽  
Structure And Properties ◽  
Oxide Thin Films ◽  
Growth Structure

Growth, Structure, and Properties of Uniformly a-Axis Oriented Ferroelectric Bi3.25La0.75Ti3O12 Thin Films on Si(100) Substrates

2002 ◽  
Vol 748 ◽  
Author(s):  
D. Hesse ◽  
H. N. Lee ◽  
N. D. Zakharov ◽  
U. Gösele
Keyword(s):  
Thin Films ◽  
Remanent Polarization ◽  
Volume Fraction ◽  
High Growth ◽  
Epitaxial Films ◽  
High Growth Rate ◽  
Structure And Properties ◽  
Stabilized Zirconia ◽  
Growth Structure ◽  
High Oxygen Pressure

ABSTRACTUniformly a-axis-oriented, epitaxially twinned Bi3.25La0.75Ti3O12 (BLT) thin films having the major spontaneous polarization entirely along the film normal were grown by pulsed laser deposition on yttria-stabilized zirconia-buffered Si(100) substrates covered with very thin SrRuO3 bottom electrodes. Using SrRuO3 bottom electrodes of a specific low thickness in combination with a relatively high growth rate and a high oxygen pressure, the volume fraction of the BLT (100) orientation, which is competing with the BLT (118) orientation, was increased up to 99%. In this way the growth of fully a-axis-oriented BLT epitaxial films was achieved, attaining a remanent polarization of 32 mC/cm2. Initial fatigue experiments indicated hardly any fatigue after 109 switching cycles.

Growth, Structure, and Properties of Uniformly a-Axis Oriented Ferroelectric Bi3.25La0.75Ti3O12 Thin Films on Si(100) Substrates

2002 ◽  
Vol 747 ◽  
Author(s):  
D. Hesse ◽  
H. N. Lee ◽  
N. D. Zakharov ◽  
U. Gösele
Keyword(s):  
Thin Films ◽  
Remanent Polarization ◽  
Volume Fraction ◽  
High Growth ◽  
Epitaxial Films ◽  
High Growth Rate ◽  
Structure And Properties ◽  
Stabilized Zirconia ◽  
Growth Structure ◽  
High Oxygen Pressure

ABSTRACTUniformly a-axis-oriented, epitaxially twinned Bi3.25La0.75Ti3O12 (BLT) thin films having the major spontaneous polarization entirely along the film normal were grown by pulsed laser deposition on yttria-stabilized zirconia-buffered Si(100) substrates covered with very thin SrRuO3 bottom electrodes. Using SrRuO3 bottom electrodes of a specific low thickness in combination with a relatively high growth rate and a high oxygen pressure, the volume fraction of the BLT (100) orientation, which is competing with the BLT (118) orientation, was increased up to 99%. In this way the growth of fully a-axis-oriented BLT epitaxial films was achieved, attaining a remanent polarization of 32 mC/cm2. Initial fatigue experiments indicated hardly any fatigue after 109 switching cycles.

Growth, structure, and properties of oxide luminophor thin films obtained by pulsed laser technology

2001 ◽  
Author(s):  
Yaroslav V. Bobitski ◽  
Bohdan K. Kotlyarchuk ◽  
Dmytro I. Popovych ◽  
Victor K. Savchuk
Keyword(s):  
Thin Films ◽  
Pulsed Laser ◽  
Structure And Properties ◽  
Laser Technology ◽  
Growth Structure

scholarly journals Growth, structure, and properties of epitaxial thin films of first-principles predicted multiferroic Bi2FeCrO6

2006 ◽  
Vol 89 (10) ◽  
pp. 102902 ◽  
Author(s):  
Riad Nechache ◽  
Catalin Harnagea ◽  
Alain Pignolet ◽  
François Normandin ◽  
Teodor Veres ◽  
...  
Keyword(s):  
Thin Films ◽  
First Principles ◽  
Epitaxial Thin Films ◽  
Structure And Properties ◽  
Growth Structure

Correlation between structure and properties of Er2O3 nanocrystalline thin films

2008 ◽  
Vol 354 (19-25) ◽  
pp. 2853-2857 ◽  
Author(s):  
Maria M. Giangregorio ◽  
Alberto Sacchetti ◽  
Maria Losurdo ◽  
Pio Capezzuto ◽  
Giovanni Bruno
Keyword(s):  
Thin Films ◽  
Structure And Properties ◽  
Nanocrystalline Thin Films
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