Chemical Bonding Effects in X-Ray Emission Spectra - A Molecular Orbital Model

1970 ◽  
Vol 14 ◽  
pp. 250-267 ◽  
Author(s):  
David S. Urch

AbstractMolecules or ions usually exist as discrete units, in crystals of chemical compounds. Intermolecular or interionic coValent interactions are slight so the bond structure of such, solids is very similar to the pattern of energy levels in each individual molecule or ion. Simple molecular orbital theory can therefore be used to generate a qualitative picture of the energy levels in a molecule or an ion; and this picture can then be used directly to interpret X-ray emission spectra. The application of molecular orbital theory, using group theory to simplify the calculations is described for a tetrahedral unit ML4. The origin of peak shifts and of low-energy satellite peaks are rationalised. A consideration of orbital amplitudes shows that the ‘cross-over' theory of O'Brien and Skinner cannot explain the observed intensities of low-energy satellite peaks. It is suggested that the use of the M. 0. model for the interpretation of X-ray emission spectra permits far greater analytical and structural use to be made of peak shift and satellite data. Ligands can be identified even when their own characteristic emissions are not detected (e.g. oxygen and fluorine). Relative peak intensities can be correlated with atomic orbital participation in bond formation. Such information is of great interest to chemists and can often be used to identify the bonding r61e of specific orbitals (e.g. the 3d orbitals of second row, main group, elements).

1996 ◽  
Vol 06 (01n02) ◽  
pp. 65-69
Author(s):  
Zonghuang Xia ◽  
Demin Wang ◽  
Shigang Wu

The mechanism of vacancy distribution in C +− B , C +− N , C +− Be , and C +− O ion-atom collision process is studied in this paper based on molecular orbital theory. It translates intensity ratio of X-ray and Auger decay in ion-atom collision process.


1989 ◽  
Vol 53 (370) ◽  
pp. 239-244 ◽  
Author(s):  
J. Purton ◽  
D. S. Urch

AbstractHigh-resolution X-ray emission spectra (XES) are presented for minerals with a variety of structures. The participation of the Si 3p orbitals in bonding is influenced by the local structure around the silicon atom. In orthosilicates the distortion of the SiO44--tetrahedron influences both peak-width and the intensity of the high-energy shoulder of the Si-Kβ spectrum. In minerals containing Si-O-Si bonds there is mixing of the Si 3s and 3p orbitals giving rise to a peak on the low-energy side of the main Si-Kβ peak. When combined with X-ray photoelectron spectra (XPS), a complete molecular orbital picture of bonding can be established.


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