Neutron Powder Diffraction at a Pulsed Neutron Source: A study of Resolution Effects

AbstractThe General Purpose Powder Diffractometer (GPPD), a high resolution (∆d/d=0.002) time-of-flight instrument, exhibits a resolution function that is almost independent of d-spacing. Some of the special properties of time-of-flight scattering data obtained at a pulsed neutron source will be discussed. A method is described that transforms wavelength dependent data, obtained at a pulsed neutron source, so that standard structural least-squares analyses can be applied. Several criteria are given to show when these techniques are useful in time-of-flight data analysis.

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The birth of time-of-flight (TOF) neutron powder diffraction at pulsed neutron source (invited)

Crystal Research and Technology ◽

10.1002/crat.201400439 ◽

2015 ◽

Vol 50 (9-10) ◽

pp. 705-715 ◽

Cited By ~ 1

Author(s):

Izabela M. Sosnowska

Keyword(s):

Neutron Source ◽

Powder Diffraction ◽

Time Of Flight ◽

Neutron Powder Diffraction ◽

Pulsed Neutron ◽

Pulsed Neutron Source

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Profile functions to reproduce Bragg reflection shapes observed by a time-of-flight single-crystal diffractometer installed at a coupled moderator pulsed neutron source in J-PARC

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment ◽

10.1016/j.nima.2013.05.015 ◽

2013 ◽

Vol 723 ◽

pp. 128-135 ◽

Cited By ~ 7

Author(s):

Katsuaki Tomoyori ◽

Katsuhiro Kusaka ◽

Taro Yamada ◽

Takaaki Hosoya ◽

Takashi Ohhara ◽

...

Keyword(s):

Single Crystal ◽

Neutron Source ◽

Bragg Reflection ◽

Time Of Flight ◽

Pulsed Neutron ◽

Pulsed Neutron Source

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High-resolution time-of-flight powder diffractometer at the ZING-P'' pulsed neutron source

Journal of Applied Crystallography ◽

10.1107/s0021889882011303 ◽

1982 ◽

Vol 15 (1) ◽

pp. 27-34 ◽

Cited By ~ 48

Author(s):

J. D. Jorgensen ◽

F. J. Rotella

Keyword(s):

High Resolution ◽

Neutron Source ◽

Time Of Flight ◽

Resolution Time ◽

Powder Diffractometer ◽

Pulsed Neutron ◽

Pulsed Neutron Source

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Residual Stress Relaxation in Cemented Carbide Composites Studied Using the Argonne Intense Pulsed Neutron Source

Advances in X-ray Analysis ◽

10.1154/s0376030800017134 ◽

1983 ◽

Vol 27 ◽

pp. 239-249 ◽

Cited By ~ 1

Author(s):

A. D. Krawitz ◽

R. Roberts ◽

J. Faber

Keyword(s):

Residual Stress ◽

Plastic Strain ◽

Neutron Source ◽

General Purpose ◽

Cemented Carbide ◽

Binder Phase ◽

Loading Mode ◽

High Plastic Strain ◽

Pulsed Neutron ◽

Pulsed Neutron Source

AbstractCemented carbide composites with a WC hard phase and a Co-Ni alloy binder phase have been subjected to monotonic and cyclic deformation and studied using the high resolution General Purpose Powder Diffractometer at the Argonne Intense Pulsed Neutron Source. Upon deformation, relaxation of bulk differential thermal residual stresses, tensile in the binder and compressive in the carbide, is observed to occur as a function of loading mode and plastic strain via shifts in diffraction peak positions. In addition, peak breadth behavior indicates broadening. At low plastic strain this is due primarily to a range of residual stress and at high plastic strain it is attributable to the plastic deformation alone since relaxation is essentially complete. The appropriateness of neutrons is discussed.

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Electronically focused time-of-flight powder diffractometers at the intense pulsed neutron source

Journal of Applied Crystallography ◽

10.1107/s002188988900289x ◽

1989 ◽

Vol 22 (4) ◽

pp. 321-333 ◽

Cited By ~ 214

Author(s):

J. D. Jorgensen ◽

J. Faber ◽

J. M. Carpenter ◽

R. K. Crawford ◽

J. R. Haumann ◽

...

Keyword(s):

High Resolution ◽

Neutron Source ◽

Rietveld Method ◽

Time Of Flight ◽

Scattering Angle ◽

Wide Range ◽

Pulsed Neutron ◽

Pulsed Neutron Source

Two time-of-flight powder diffractometers have operated at the Intense Pulsed Neutron Source (IPNS) since August 1981. These instruments use dedicated microcomputers to focus time-of-flight events so that data from different detectors can be summed into a single histogram. Thus, large multidetector arrays can be employed at any scattering angle from 12 to 157°. This design permits data to be collected over a uniquely wide range of d spacings while maintaining high resolution and count rates. The performance of the two instruments is evaluated by analyzing data from a standard Al2O3 sample by the Rietveld method. These instruments provide the capability for moderate- to high-resolution measurements with the duration of a typical run being a few hours.

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