scholarly journals TFI-FTS: An efficient transient fault injection and fault-tolerant system for asynchronous circuits on FPGA platform

Author(s):  
Sharath Kumar Y. N. ◽  
Dinesha P.

Designing VLSI digital circuits is challenging tasks because of testing the circuits concerning design time. The reliability and productivity of digital integrated circuits are primarily affected by the defects in the manufacturing process or systems. If the defects are more in the systems, which leads the fault in the systems. The fault tolerant systems are necessary to overcome the faults in the VLSI digital circuits. In this research article, an asynchronous circuits based an effective transient fault injection (TFI) and fault tolerant system (FTS) are modelled. The TFI system generates the faults based on BMA based LFSR with faulty logic insertion and one hot encoded register. The BMA based LFSR reduces the hardware complexity with less power consumption on-chip than standard LFSR method. The FTS uses triple mode redundancy (TMR) based majority voter logic (MVL) to tolerant the faults for asynchronous circuits. The benchmarked 74X-series circuits are considered as an asynchronous circuit for TMR logic. The TFI-FTS module is modeled using Verilog-HDL on Xilinx-ISE and synthesized on hardware platform. The Performance parameters are tabulated for TFI-FTS based asynchronous circuits. The performance of TFI-FTS Module is analyzed with 100% fault coverage. The fault coverage is validated using functional simulation of each asynchronous circuit with fault injection in TFI-FTS Module.

Author(s):  
Peter Marwedel

AbstractUnfortunately, we cannot rely on designed and possibly already manufactured systems to operate as expected. These systems may have become defective during their use, or their function may have been compromised during the fabrication or their design. The purpose of testing is to verify whether or not an existing embedded/cyber-physical system can be operated as expected. In this chapter, we will present fundamental terms and techniques for testing. There will be a brief introduction to the aims of test pattern generation and their application. We will be introducing terms such as fault model, fault coverage, fault simulation, and fault injection. Also, we will be presenting techniques which improve testability, including the generation of pseudo-random patterns, and signature analysis. It would be beneficial to consider testability issues already during design. In case of fault-tolerant systems, resilience must be verified.


2011 ◽  
Vol 14 (4) ◽  
pp. 24-33
Author(s):  
Vu Duc Anh Dinh

FPGA device is a dominant implementation medium for digital circuits. Unfortunately, they do not support asynchronous circuits because of the lack of asynchronous circuit elements such as Muller gates, etc. In this paper, new efficient approaches are proposed to prototype asynchronous circuits on Look-Up Table-based (LUT) FPGA rapidly. The developed techniques are based on building of elements which play an important role in asynchronous circuits. The hazard-free elements are predefined in libraries in HDL and EDIF format. Timing and/or area constraints for place&route tool are automatically generated to map the asynchronous elements on suitable FPGA’s logic blocks. Several FPGA devices such as Altera, Xilinx and Actel could be used as target for the implementation.


VLSI Design ◽  
1998 ◽  
Vol 5 (4) ◽  
pp. 373-383 ◽  
Author(s):  
Jien-Chung Lo

In this paper, we analyze the reliability of self-checking circuits. A case study is presented in which a fault-tolerant system with duplicated self-checking modules is compared to the TMR version. It is shown that a duplicated self-checking system has a much higher reliability than that of the TMR counterpart. More importantly, the reliability of the self-checking system does not drop as sharply as that of the TMR version. We also demonstrate the trade-offs between hardware complexity and error handling capability of self-checking circuits. Alternative self-checking designs where some hardware redundancies are removed with the lost of fault-secure and/or self-testing properties are also studied.


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