Surface Analysis of Wool by X-Ray Photoelectron Spectroscopy and Static Secondary Ion Mass Spectrometry

Textile Research Journal ◽

10.1177/004051759306300609 ◽

1993 ◽

Vol 63 (6) ◽

pp. 362-368 ◽

Author(s):

R.J. Ward ◽

H.A. Willis ◽

G.A. George ◽

G.B. Guise ◽

R.J. Denning ◽

...

Keyword(s):

Mass Spectrometry ◽

Surface Analysis ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

X Ray ◽

Ion Mass Spectrometry ◽

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Surface analysis: x-ray photoelectron spectroscopy, Auger electron spectroscopy, and secondary ion mass spectrometry

Analytical Chemistry ◽

10.1021/ac00242a027 ◽

1982 ◽

Vol 54 (5) ◽

pp. 293-322 ◽

Author(s):

Noel H. Turner ◽

Richard J. Colton

Keyword(s):

Mass Spectrometry ◽

Auger Electron Spectroscopy ◽

Surface Analysis ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Secondary Ion Mass Spectrometry ◽

X Ray ◽

Ion Mass Spectrometry ◽

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Reply to "Comments on 'Surface Analysis of Wool by X-Ray Photoelectron Spectroscopy and Static Secondary Ion Mass Spectrometry' "

Textile Research Journal ◽

10.1177/004051759406400814 ◽

1994 ◽

Vol 64 (8) ◽

pp. 493-493

Author(s):

R.J. Ward ◽

H.A. Willis ◽

G.A. George ◽

G.B. Guise ◽

R.J. Denning ◽

...

Keyword(s):

Mass Spectrometry ◽

Surface Analysis ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

X Ray ◽

Ion Mass Spectrometry ◽

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ChemInform Abstract: SURFACE ANALYSIS: X-RAY PHOTOELECTRON SPECTROSCOPY, AUGER ELECTRON SPECTROSCOPY, AND SECONDARY ION MASS SPECTROMETRY

Chemischer Informationsdienst ◽

10.1002/chin.198249370 ◽

1982 ◽

Vol 13 (49) ◽

Author(s):

N. H. TURNER ◽

R. J. COLTON

Keyword(s):

Mass Spectrometry ◽

Auger Electron Spectroscopy ◽

Surface Analysis ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Secondary Ion Mass Spectrometry ◽

X Ray ◽

Ion Mass Spectrometry ◽

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Comments on "Surface Analysis of Wool by X-Ray Photoelectron Spectroscopy and Static Secondary Ion Mass Spectrometry"

Textile Research Journal ◽

10.1177/004051759406400813 ◽

1994 ◽

Vol 64 (8) ◽

pp. 492-493 ◽

Author(s):

Douglas A. Rankin Wronz

Keyword(s):

Mass Spectrometry ◽

Surface Analysis ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

X Ray ◽

Ion Mass Spectrometry ◽

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Surface analysis: x-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary ion mass spectrometry

Analytical Chemistry ◽

10.1021/ac00269a026 ◽

1984 ◽

Vol 56 (5) ◽

pp. 373-416 ◽

Author(s):

Noel H. Turner ◽

Brett I. Dunlap ◽

Richard J. Colton

Keyword(s):

Mass Spectrometry ◽

Auger Electron Spectroscopy ◽

Surface Analysis ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Secondary Ion Mass Spectrometry ◽

X Ray ◽

Ion Mass Spectrometry ◽

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X-Ray Photoelectron Spectroscopy and Secondary Ion Mass Spectrometry: A Multitechnique Approach to Surface Analysis

Quantitive Surface Analysis of Materials ◽

10.1520/stp25608s ◽

2009 ◽

pp. 187-187-17 ◽

Author(s):

A Shepard ◽

RW Hewitt ◽

WE Baitinger ◽

GJ Slusser ◽

N Winograd ◽

...

Keyword(s):

Mass Spectrometry ◽

Surface Analysis ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

X Ray ◽

Ion Mass Spectrometry ◽

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Surface Analysis of Pulverised Fuel Ash by Secondary Ion Mass Spectrometry and X-ray Photoelectron Spectroscopy

Particle & Particle Systems Characterization ◽

10.1002/ppsc.19860030208 ◽

1986 ◽

Vol 3 (2) ◽

pp. 89-95 ◽

Author(s):

Geoffrey C. Allen ◽

Anthony G. Warner ◽

Allan R. Jones

Keyword(s):

Mass Spectrometry ◽

Surface Analysis ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

X Ray ◽

Fuel Ash ◽

Ion Mass Spectrometry ◽

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Comparison of static secondary ion mass spectrometry, ion scattering spectroscopy, and x-ray photoelectron spectroscopy for surface analysis of acrylic polymers

Analytical Chemistry ◽

10.1021/ac00235a037 ◽

1981 ◽

Vol 53 (12) ◽

pp. 1879-1884 ◽

Author(s):

Joseph A. Gardella ◽

David M. Hercules

Keyword(s):

Mass Spectrometry ◽

Surface Analysis ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Ion Scattering ◽

Acrylic Polymers ◽

X Ray ◽

Ion Scattering Spectroscopy ◽

Ion Mass Spectrometry ◽

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Time‐of‐flight secondary ion mass spectrometry and X‐ray photoelectron spectroscopy study of 2‐phenylimidazole on brass

Rapid Communications in Mass Spectrometry ◽

10.1002/rcm.8974 ◽

2020 ◽

Vol 35 (2) ◽

Author(s):

Matjaž Finšgar

Keyword(s):

Mass Spectrometry ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Spectroscopy Study ◽

X Ray ◽

Ion Mass Spectrometry ◽

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Probing albumin adsorption onto calcium phosphates by x-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry

Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena ◽

10.1116/1.3613919 ◽

2011 ◽

Vol 29 (4) ◽

pp. 04D113 ◽

Author(s):

J. E. Baio ◽

T. Weidner ◽

G. Interlandi ◽

C. Mendoza-Barrera ◽

H. E. Canavan ◽

...

Keyword(s):

Mass Spectrometry ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Calcium Phosphates ◽

Time Of Flight ◽

X Ray ◽

Ion Mass Spectrometry ◽

Albumin Adsorption ◽

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