Flexural sensitivity of high resonant atomic force microscopy cantilever based on optical lever detection

2014 ◽  
Vol 230 (2) ◽  
pp. 76-80 ◽  
Author(s):  
Zhao Yang ◽  
Huang Qiangxian ◽  
Yuan Dan ◽  
Hu Xiaojuan ◽  
Cheng Zhenying
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Optical Lever ◽  
Atomic Force Microscopy Cantilever

scholarly journals Detection of atomic force microscopy cantilever displacement with a transmitted electron beam

2016 ◽  
Vol 109 (4) ◽  
pp. 043111 ◽  
Author(s):  
R. Wagner ◽  
T. J. Woehl ◽  
R. R. Keller ◽  
J. P. Killgore
Keyword(s):  
Atomic Force Microscopy ◽  
Electron Beam ◽  
Force Microscopy ◽  
Atomic Force ◽  
Atomic Force Microscopy Cantilever
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