Modeling and analysis of software fault detectability and removability with time variant fault exposure ratio, fault removal efficiency, and change point

2018 ◽  
Vol 233 (2) ◽  
pp. 246-256 ◽  
Author(s):  
Subhashis Chatterjee ◽  
Ankur Shukla ◽  
Hoang Pham
Keyword(s):  
Removal Efficiency ◽  
Software Reliability ◽  
Change Point ◽  
Growth Models ◽  
Reliability Growth ◽  
Modeling And Analysis ◽  
Software Reliability Growth ◽  
Software Fault ◽  
Fault Removal ◽  
Exposure Ratio

Software reliability growth models have been proposed to assess and predict the reliability growth of software, remaining number of faults, and failure rate. In previous studies, software faults have been mainly categorized into two categories based on its severity in removal process: simple faults and hard faults. In reality, fault detectability is one of the crucial factors which can influence the reliability growth of software. The detectability of a software fault depends on how frequently the instructions containing faults are executed. However, fault removability of a software fault depends on fault removal efficiency of debugging team. The main motive of this article is to incorporate the fault detectability in software reliability assessment. Fault exposure ratio is an essential factor for software reliability modeling that controls the per-fault hazard rate. It is strongly dependent on fault detectability. In this article, the effect of fault detectability, fault removability, fault exposure ratio, and fault removal efficiency has been considered simultaneously in software reliability growth modeling. Moreover, a logistic fault exposure ratio has been introduced. The effect of change point is incorporated in the proposed software reliability growth model. Two illustrative examples with software testing data have been presented.

SOFTWARE RELIABILITY ASSESSMENT USING ARTIFICIAL NEURAL NETWORK BASED FLEXIBLE MODEL INCORPORATING FAULTS OF DIFFERENT COMPLEXITY

2008 ◽  
Vol 15 (02) ◽  
pp. 113-127 ◽  
Author(s):  
P. K. KAPUR ◽  
SUNIL K. KHATRI ◽  
MASHAALLAH BASIRZADEH
Keyword(s):  
Neural Network ◽  
Software Reliability ◽  
Growth Models ◽  
Reliability Assessment ◽  
Reliability Growth ◽  
Removal Process ◽  
Proposed Model ◽  
Software Reliability Growth ◽  
Fault Removal ◽  
Artificial Neural

With growth in demand for zero defects, predicting reliability of software products is gaining importance. Software Reliability Growth Models (SRGM) are used to estimate the reliability of a software product. We have a large number of SRGM; however none of them works across different environments. Recently, Artificial Neural Networks have been applied in software reliability assessment and software reliability growth prediction. In most of the existing research available in the literature, it is considered that similar testing effort is required on each debugging effort. However, in practice, different amount of testing efforts may be required for detection and removal of different type of faults on basis of their complexity. Consequently, faults are classified into three categories on basis of complexity: simple, hard and complex. In this paper we apply neural network methods to build software reliability growth models (SRGM) considering faults of different complexity. Logistic learning function accounting for the expertise gained by the testing team is used for modeling the proposed model. The proposed model assumes that in the simple faults the growth in removal process is uniform whereas, for hard and complex faults, removal process follows logistic growth curve due to the fact that learning of removal team grows as testing progresses. The proposed model has been validated, evaluated and compared with other NHPP model by applying it on two failure/fault removal data sets cited from real software development projects. The results show that the proposed model with logistic function provides improved goodness-of-fit for software failure/fault removal data.

An Ideal Software Release Policy for an Improved Software Reliability Growth Model Incorporating Imperfect Debugging with Fault Removal Efficiency and Change Point

2017 ◽  
Vol 34 (03) ◽  
pp. 1740017 ◽  
Author(s):  
Subhashis Chatterjee ◽  
Ankur Shukla
Keyword(s):  
Removal Efficiency ◽  
Software Reliability ◽  
Maintenance Cost ◽  
Reliability Growth ◽  
Software Reliability Growth Model ◽  
Imperfect Debugging ◽  
Software Release ◽  
Software Reliability Growth ◽  
Warranty Cost ◽  
Fault Removal

This paper presents a general software reliability growth model (SRGM) based on non-homogeneous Poisson process (NHPP) and optimal software release policy with cost and reliability criteria. The main motive of this study is to develop a software release time decision model considering maintenance cost and warranty cost under fuzzy environment. In previous studies, maintenance cost has been defined either in terms of warranty cost or fault debugging cost. In reality, maintenance cost includes the cost of free patches, updates, technical support and future enhancement. Also, it is possible that maintenance process causes the removal of software faults in the operational phase including the faults which occur outside the warranty period or warranty definition. In other words, warranty action may be included the maintenance action, but not the converse. Considering this fact, maintenance cost and warranty cost are defined separately in the proposed study. Initially, an SRGM has been proposed with the revised concept of imperfect debugging phenomenon considering fault removal efficiency (FRE). Furthermore, the effect of changes in various environmental factors on models parameters has been taken into account. Numerical examples based on real software failure data sets have been given to analyze the performance of the proposed models.

Change point–based software reliability model under imperfect debugging with revised concept of fault dependency

2016 ◽  
Vol 230 (6) ◽  
pp. 579-597 ◽  
Author(s):  
Subhashis Chatterjee ◽  
Ankur Shukla
Keyword(s):  
Software Reliability ◽  
Change Point ◽  
Growth Models ◽  
Reliability Growth ◽  
Imperfect Debugging ◽  
Software Reliability Growth Models ◽  
Software Reliability Growth ◽  
Fault Dependency ◽  
Different Characteristics ◽  
Types Of Faults

A detailed study about the characteristics of different types of faults is necessary to enhance the accuracy of software reliability estimation. Over the last three decades, some software reliability growth models have been proposed considering the possibility of existence of two types of faults in a software: (1) independent and (2) dependent faults. In these software reliability growth models, it is considered that the removal of a leading fault or independent fault causes detection of corresponding dependent faults. In practical, it is noticed that some dependent faults are possible in a software which are removed during the removal of other faults. Moreover, dependent faults may have different characteristics, which cannot be ignored. Considering these facts, a detailed study about the different characteristics of both dependent and independent faults has been performed, and based on this study, dependent faults have been categorized into different categories. Furthermore, a new software reliability growth model has been proposed with revised concept of fault dependency under imperfect debugging by introducing the fault removal proportionality. In addition, the effect of change point on model’s parameters due to different environmental factors has been considered. The fault reduction factor is considered as a proportionality function. Experimental results establish the fact that the performance of the proposed model is better with respect to estimated and predicted cumulative number of faults on some real software failure datasets.

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