The effect of driver advisory systems on train driver workload and performance

Author(s):  
David Large ◽  
David Golightly ◽  
Emma Taylor
1989 ◽  
Vol 21 (9) ◽  
pp. 1241-1263 ◽  
Author(s):  
P N O'Farrell ◽  
D M W N Hitchens

In this paper we present a comparative analysis of the competitiveness and performance of matched pairs of small manufacturing companies in Scotland and the south of England. Several aspects of performance are investigated, and evaluations of the price and quality competitiveness of the product samples are made. One-third of Scottish products were judged to be of an unacceptable quality by the matched English companies. English companies are manufacturing to a higher quality but at a similar price to the Scottish ones. English firms displayed higher levels of skill and were more aware of the need to train. The empirical evidence provides confirmation of the conceptual framework, namely that production-related issues lie at the core of the problem of competitiveness for small companies. The findings suggest that government assistance should shift away from fixed assets to soft assets, and especially towards training and advisory systems.


2013 ◽  
pp. 150-159 ◽  
Author(s):  
Simon Tschirner ◽  
Arne Andersson ◽  
Bengt Sandblad

Author(s):  
Kayla L. Riegner ◽  
Jennifer Ammori ◽  
Brian E. O’Hearn ◽  
Kelly S. Steelman

To enable indirect-driving maneuverability and threat detection in degraded visual environments (DVE), TARDEC’s ground DVE program is developing and testing a range of sensors and driver aid display systems. The current paper presents the first in a series of three simulator studies. It examined driver performance with two of the candidate driving aids, the Lane/Road Departure Warning System (LRDWS) and Optic Flow Enhancer (OFE), in three levels of degraded visual environment. Results indicated that the LRDWS best supported drivers in degraded visual environments, eliciting the lowest workload ratings and highest system usability ratings and facilitating faster driving in severe DVE conditions, with no apparent speed-accuracy tradeoff.


Author(s):  
H. M. Thieringer

It has repeatedly been show that with conventional electron microscopes very fine electron probes can be produced, therefore allowing various micro-techniques such as micro recording, X-ray microanalysis and convergent beam diffraction. In this paper the function and performance of an SIEMENS ELMISKOP 101 used as a scanning transmission microscope (STEM) is described. This mode of operation has some advantages over the conventional transmission microscopy (CTEM) especially for the observation of thick specimen, in spite of somewhat longer image recording times.Fig.1 shows schematically the ray path and the additional electronics of an ELMISKOP 101 working as a STEM. With a point-cathode, and using condensor I and the objective lens as a demagnifying system, an electron probe with a half-width ob about 25 Å and a typical current of 5.10-11 amp at 100 kV can be obtained in the back focal plane of the objective lens.


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