The results of the study Bouctouche processor series 1867

10.12737/4053 ◽  
2014 ◽  
Vol 6 (4) ◽  
pp. 72-74
Author(s):  
Ачкасов ◽  
A. Achkasov ◽  
Конарев ◽  
M. Konarev ◽  
Яньков ◽  
...  
Keyword(s):  
Charged Particles ◽  
Manufacturing Technology ◽  
Heavy Charged Particles ◽  
Latch Up

Resistance is Investigated microprocessor series 1867. The results show that manufacturing technology and applied circuit solutions in process of designing chips VT mode marinovannogo of RAM is entirely eliminate the occurrence of single failures and latch-up when exposed to heavy charged particles.

scholarly journals Microbeams of Heavy Charged Particles

2004 ◽  
Vol 18 (4) ◽  
pp. 235-240 ◽  
Author(s):  
Yasuhiko Kobayashi ◽  
Tomoo Funayama ◽  
Seiichi Wada ◽  
Yoshiya Furusawa ◽  
Mizuho Aoki ◽  
...  
Keyword(s):  
Charged Particles ◽  
Heavy Charged Particles

Response of TLD-300 to Heavy Charged Particles

1999 ◽  
Vol 84 (1) ◽  
pp. 273-275 ◽  
Author(s):  
A.E. Buenfil ◽  
I. Gamboa-deBuen ◽  
C. Ruiz-Trejo ◽  
C. Olvera ◽  
M. Rodriguez-Villafuerte ◽  
...  
Keyword(s):  
Charged Particles ◽  
Heavy Charged Particles

Correlation between CT number and water-equivalent thickness for heavy charged particles

2000 ◽  
pp. 362-364 ◽  
Author(s):  
Eike Rietzel ◽  
Oliver Geiß ◽  
Dieter Schardt ◽  
Bernd Voss ◽  
Michael Krämer ◽  
...  
Keyword(s):  
Charged Particles ◽  
Ct Number ◽  
Equivalent Thickness ◽  
Heavy Charged Particles
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