Thermal Deformation Analysis of Electronic Device using Finite Element Method and Moire Interferometry
2002 ◽
Vol 2002.15
(0)
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pp. 333-334
1989 ◽
Vol 11
(1)
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pp. 15-25
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2004 ◽
Vol 35
(8-9)
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pp. 503-509
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2007 ◽
Vol 47
(4)
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pp. 533-547
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Keyword(s):
2002 ◽
Vol 2002.15
(0)
◽
pp. 489-490
Keyword(s):
2006 ◽
Vol 2006.19
(0)
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pp. 691-692
1975 ◽
Vol 41
(485)
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pp. 512-519
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1988 ◽
Vol 25
(2)
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pp. 87
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2013 ◽
Vol 19
(5)
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pp. 1069-1076
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Keyword(s):