The Theory and Experiment for a Rectangular Plate placed on Elastic Beams (First Report)

1932 ◽  
Vol 35 (183) ◽  
pp. 709-717
Author(s):  
Chuji FUJII
1977 ◽  
Vol 99 (4) ◽  
pp. 913-915
Author(s):  
T. Willis ◽  
M. K. Pal

The work reported here is a simplified approximate analysis to take into account, the effects of allowing the supported edges of a rectangular plate to deflect, both in bending deflection, and in rotational (twisting) deflection and is for a plate with two opposite edges simply supported, the two remaining edges supported on elastic beams with finite flexural and torsional rigidity.


2006 ◽  
Vol 4 ◽  
pp. 11-22
Author(s):  
A.M. Akhtyamov ◽  
A.V. Muftakhov

A rectangular plate is considered, in which two opposite edges are freely supported, while the other two are supported by elastic beams. In this paper, we prove the duality of the solution of the problem of finding the rigidities of elastic beams by all natural oscillation frequencies of a plate. It is also shown that if the rank of a certain matrix is equal to 9, then both solutions of the problem of finding the rigidities of elastic beams can be found from 9 natural frequencies.


1988 ◽  
Vol 62 (01) ◽  
pp. 141-143 ◽  
Author(s):  
Gerard M. Thomas ◽  
George O. Poinar

A sporulating Aspergillus is described from a piece of Eocene amber originating from the Dominican Republic. The Aspergillus most closely resembles a form of the white spored phase of Aspergillus janus Raper and Thom. This is the first report of a fossil species of Aspergillus.


Author(s):  
Gertrude F. Rempfer

I became involved in electron optics in early 1945, when my husband Robert and I were hired by the Farrand Optical Company. My husband had a mathematics Ph.D.; my degree was in physics. My main responsibilities were connected with the development of an electrostatic electron microscope. Fortunately, my thesis research on thermionic and field emission, in the late 1930s under the direction of Professor Joseph E. Henderson at the University of Washington, provided a foundation for dealing with electron beams, high vacuum, and high voltage.At the Farrand Company my co-workers and I used an electron-optical bench to carry out an extensive series of tests on three-electrode electrostatic lenses, as a function of geometrical and voltage parameters. Our studies enabled us to select optimum designs for the lenses in the electron microscope. We early on discovered that, in general, electron lenses are not “thin” lenses, and that aberrations of focal point and aberrations of focal length are not the same. I found electron optics to be an intriguing blend of theory and experiment. A laboratory version of the electron microscope was built and tested, and a report was given at the December 1947 EMSA meeting. The micrograph in fig. 1 is one of several which were presented at the meeting. This micrograph also appeared on the cover of the January 1949 issue of Journal of Applied Physics. These were exciting times in electron microscopy; it seemed that almost everything that happened was new. Our opportunities to publish were limited to patents because Mr. Farrand envisaged a commercial instrument. Regrettably, a commercial version of our laboratory microscope was not produced.


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