Assessment of surface roughness by x-ray scattering and differential interference contrast microscopy

1979 ◽  
Vol 18 (2) ◽  
pp. 236 ◽  
Author(s):  
P. A. J. de Korte ◽  
R. Lainé
Keyword(s):  
Surface Roughness ◽  
Differential Interference Contrast ◽  
Differential Interference Contrast Microscopy ◽  
X Ray ◽  
X Ray Scattering ◽  
Contrast Microscopy ◽  
Interference Contrast Microscopy ◽  
Ray Scattering

Single-element objective lens for soft x-ray differential interference contrast microscopy

2006 ◽  
Vol 31 (10) ◽  
pp. 1564 ◽  
Author(s):  
Chang Chang ◽  
Anne Sakdinawat ◽  
Peter Fischer ◽  
Erik Anderson ◽  
David Attwood
Keyword(s):  
Objective Lens ◽  
Single Element ◽  
Differential Interference Contrast ◽  
Differential Interference Contrast Microscopy ◽  
X Ray ◽  
Contrast Microscopy ◽  
Interference Contrast Microscopy

Differential interference contrast microscopy for cells using hard x-ray holography

2018 ◽  
Vol 57 (17) ◽  
pp. 4795 ◽  
Author(s):  
K. Matsuda ◽  
J. C. A. Lopez ◽  
S. Rehman ◽  
M. Misawa ◽  
Y. Suzuki ◽  
...  
Keyword(s):  
Differential Interference Contrast ◽  
Differential Interference Contrast Microscopy ◽  
X Ray ◽  
Contrast Microscopy ◽  
Interference Contrast Microscopy

A HgCdTe/CdTe/GaAs/Si Epitaxial Structure

1986 ◽  
Vol 67 ◽  
Author(s):  
K. Zanio ◽  
R. Bean ◽  
K. Hay ◽  
R. Fischer ◽  
H. Morkoc
Keyword(s):  
Vapor Transport ◽  
Differential Interference Contrast ◽  
Infrared Transmission ◽  
Differential Interference Contrast Microscopy ◽  
Epitaxial Structure ◽  
X Ray ◽  
Electron Channelling ◽  
Contrast Microscopy ◽  
Interference Contrast Microscopy

ABSTRACTFour layer HgCdTe/CdTe/GaAs/Si structures have been prepared by the sequential growth of (100) GaAs on (100) Si by MBE, (100) CdTe on GaAs/Si by congruent evaporation in UHV and (100) HgCdTe on CdTe/GaAs/Si by vapor transport. Infrared transmission, X-ray rocking curves, differential interference contrast microscopy and selected area electron channelling patterns characterize the structures.

scholarly journals Optical sectioning in differential interference contrast microscopy

2009 ◽  
Vol 282 (16) ◽  
pp. 3223-3230 ◽  
Author(s):  
Atsushi Noguchi ◽  
Hiroshi Ishiwata ◽  
Masahide Itoh ◽  
Toyohiko Yatagai
Keyword(s):  
Differential Interference Contrast ◽  
Differential Interference Contrast Microscopy ◽  
Optical Sectioning ◽  
Contrast Microscopy ◽  
Interference Contrast Microscopy
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