Determination of optical constants of thin films and multilayer stacks by use of concurrent reflectance, transmittance, and ellipsometric measurements
1981 ◽
Vol 20
(9)
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pp. L665-L668
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1976 ◽
Vol 18
(3)
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pp. 387-390
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Keyword(s):
2020 ◽
Vol 14
(6)
◽
pp. 2000070
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