Adaptation Mechanism for Digital Spectrum-based Soft Failure Identification

2020 ◽  
Author(s):  
Liang Shu ◽  
Zhenming Yu ◽  
Zhiquan Wan ◽  
Kun Xu
Keyword(s):  
Adaptation Mechanism ◽  
Soft Failure ◽  
Digital Spectrum ◽  
Failure Identification

Generalized Soft Failure Identification enabled by Digital Residual Spectrum and Autoencoder

2021 ◽  
Author(s):  
Kaixuan Sun ◽  
Zhenming Yu ◽  
Liang Shu ◽  
Zhiquan Wan ◽  
Kun Xu
Keyword(s):  
Residual Spectrum ◽  
Soft Failure ◽  
Failure Identification

Low-complexity dual-stage soft failure detection by exploiting digital spectrum information

2019 ◽  
Author(s):  
Liang Shu ◽  
Zhenming Yu ◽  
Zhiquan Wan ◽  
Jing Zhang ◽  
Shaohua Hu ◽  
...  
Keyword(s):  
Failure Detection ◽  
Low Complexity ◽  
Soft Failure ◽  
Digital Spectrum ◽  
Dual Stage

scholarly journals Low-complexity storage-reduced digital spectrum-based soft-failure management with Welch’s method

2020 ◽  
Vol 28 (9) ◽  
pp. 12529
Author(s):  
Liang Shu ◽  
Zhenming Yu ◽  
Zhiquan Wan ◽  
Kun Xu
Keyword(s):  
Low Complexity ◽  
Soft Failure ◽  
Digital Spectrum

Learning from the Optical Spectrum: Soft-Failure Identification and Localization [Invited]

2018 ◽  
Author(s):  
Luis Velasco ◽  
Behnam Shariati ◽  
Alba P. Vela ◽  
Jaume Comellas ◽  
Marc Ruiz
Keyword(s):  
Optical Spectrum ◽  
Soft Failure ◽  
Failure Identification

Application of Conductive-AFM in Soft Failure Analysis

2017 ◽  
Author(s):  
Chuan Zhang ◽  
Yinzhe Ma ◽  
Gregory Dabney ◽  
Oh Chong Khiam ◽  
Esther P.Y. Chen
Keyword(s):  
Failure Analysis ◽  
Conductive Atomic Force Microscopy ◽  
Test Parameter ◽  
Conductive Afm ◽  
Force Microscopy ◽  
Analysis Methodology ◽  
Soft Failure ◽  
Atomic Force ◽  
Test Conditions ◽  
Sensitive Characteristics

Abstract Soft failures are among the most challenging yield detractors. They typically show test parameter sensitive characteristics, which would pass under certain test conditions but fail under other conditions. Conductive-atomic force microscopy (CAFM) emerged as an ideal solution for soft failure analysis that can balance the time and thoroughness. By inserting CAFM into the soft failure analysis flow, success rate of such type of analysis can be significantly enhanced. In this paper, a logic chain soft failure and a SRAM local bitline soft failure are used as examples to illustrate how this failure analysis methodology provides a powerful and efficient solution for soft failure analysis.

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