Learning from the Optical Spectrum: Soft-Failure Identification and Localization [Invited]

2018 ◽  
Author(s):  
Luis Velasco ◽  
Behnam Shariati ◽  
Alba P. Vela ◽  
Jaume Comellas ◽  
Marc Ruiz
Keyword(s):  
Optical Spectrum ◽  
Soft Failure ◽  
Failure Identification

Generalized Soft Failure Identification enabled by Digital Residual Spectrum and Autoencoder

2021 ◽  
Author(s):  
Kaixuan Sun ◽  
Zhenming Yu ◽  
Liang Shu ◽  
Zhiquan Wan ◽  
Kun Xu
Keyword(s):  
Residual Spectrum ◽  
Soft Failure ◽  
Failure Identification

Application of Conductive-AFM in Soft Failure Analysis

2017 ◽  
Author(s):  
Chuan Zhang ◽  
Yinzhe Ma ◽  
Gregory Dabney ◽  
Oh Chong Khiam ◽  
Esther P.Y. Chen
Keyword(s):  
Failure Analysis ◽  
Conductive Atomic Force Microscopy ◽  
Test Parameter ◽  
Conductive Afm ◽  
Force Microscopy ◽  
Analysis Methodology ◽  
Soft Failure ◽  
Atomic Force ◽  
Test Conditions ◽  
Sensitive Characteristics

Abstract Soft failures are among the most challenging yield detractors. They typically show test parameter sensitive characteristics, which would pass under certain test conditions but fail under other conditions. Conductive-atomic force microscopy (CAFM) emerged as an ideal solution for soft failure analysis that can balance the time and thoroughness. By inserting CAFM into the soft failure analysis flow, success rate of such type of analysis can be significantly enhanced. In this paper, a logic chain soft failure and a SRAM local bitline soft failure are used as examples to illustrate how this failure analysis methodology provides a powerful and efficient solution for soft failure analysis.

An Improved Optical Spectrum and New Model Fits of the Likely Brown Dwarf GD 165B

1999 ◽  
Vol 519 (2) ◽  
pp. 834-843 ◽  
Author(s):  
J. Davy Kirkpatrick ◽  
France Allard ◽  
Tom Bida ◽  
Ben Zuckerman ◽  
E. E. Becklin ◽  
...  
Keyword(s):  
Optical Spectrum ◽  
Brown Dwarf ◽  
New Model ◽  
Model Fits
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