Abstract
Surface differential reflectivity (SDR) and reflectance anisotropy spectroscopy (RAS) [sometimes known as reflectance difference spectroscopy] are two well-known optical spectroscopies used in the investigation of surfaces and interfaces. Their adaptability on different experimental conditions (vacuum, controlled atmosphere and liquid environment) allows for the investigation not only of surface states and/or ultra-thin films but also of more complex interfaces. In these circumstances, the analysis of the sample with both techniques is decisive in view of obtaining a correct picture of the sample optical properties. In this work, we show a microelectronic hardware solution useful to control both a SDR and a RAS apparatus. We describe an electronic architecture that can be easily replicated, and we applied it to a representative sample where the interpretation of the optical properties requires an analysis by both SDR and RAS.
Graphic abstract
A microprocessor-aided platform enabling surface differential reflectivity and reflectance anisotropy spectroscopy
