High power, high reliability ErYb optical amplifiers

Author(s):  
Douglas P. Holcomb
2005 ◽  
Vol 1 (03) ◽  
pp. 396-402
Author(s):  
A. Sudrià ◽  
◽  
E. Jaureguialzo ◽  
A. Samper ◽  
R. Villafáfila ◽  
...  

2021 ◽  
Vol 79 (6) ◽  
pp. 631-640
Author(s):  
Takaaki Tsunoda ◽  
Takeo Tsukamoto ◽  
Yoichi Ando ◽  
Yasuhiro Hamamoto ◽  
Yoichi Ikarashi ◽  
...  

Electronic devices such as medical instruments implanted in the human body and electronic control units installed in automobiles have a large impact on human life. The electronic circuits in these devices require highly reliable operation. Radiographic testing has recently been in strong demand as a nondestructive way to help ensure high reliability. Companies that use high-density micrometer-scale circuits or lithium-ion batteries require high speed and high magnification inspection of all parts. The authors have developed a new X-ray source supporting these requirements. The X-ray source has a sealed tube with a transmissive target on a diamond window that offers advantages over X-ray sources having a sealed tube with a reflective target. The X-ray source provides high-power-density X-ray with no anode degradation and a longer shelf life. In this paper, the authors will summarize X-ray source classification relevant to electronic device inspection and will detail X-ray source performance requirements and challenges. The paper will also elaborate on technologies employed in the X-ray source including tube design implementations for high-power-density X-ray, high resolution, and high magnification simultaneously; reduced system downtime for automated X-ray inspection; and reduced dosages utilizing quick X-ray on-and-off emission control for protection of sensitive electronic devices.


2011 ◽  
Vol 38 (8) ◽  
pp. 0802011
Author(s):  
崔锦江 Cui Jinjiang ◽  
宁永强 Ning Yongqiang ◽  
姜琛昱 Jiang Chenyu ◽  
王帆 Wang Fan ◽  
施燕博 Shi Yanbo ◽  
...  

2018 ◽  
Vol 11 (4) ◽  
pp. 590-603
Author(s):  
仇伯仓 QIU Bo-cang ◽  
胡海 MARTIN Hai HU ◽  
汪卫敏 WANG Wei-min ◽  
刘文斌 LIU Wen-bin ◽  
白雪 BAI Xue

1987 ◽  
Vol 5 (9) ◽  
pp. 1263-1268 ◽  
Author(s):  
Y. Nakajima ◽  
H. Higuchi ◽  
Y. Kokubo ◽  
Y. Sakakibara ◽  
S. Kakimoto ◽  
...  

Author(s):  
Pei Li ◽  
Peng Li ◽  
Xu Luo ◽  
Liming Xu ◽  
Zhijie Zhou ◽  
...  

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