scholarly journals Unimorph deformable mirror for space telescopes: environmental testing

2016 ◽  
Vol 24 (2) ◽  
pp. 1528 ◽  
Author(s):  
Peter Rausch ◽  
Sven Verpoort ◽  
Ulrich Wittrock
Keyword(s):  
Deformable Mirror ◽  
Space Telescopes ◽  
Environmental Testing

scholarly journals GMTIFS: deformable mirror environmental testing for the on-instrument wavefront sensor

2016 ◽  
Author(s):  
M. Copeland ◽  
I Price ◽  
F. Rigaut ◽  
G. Bloxham ◽  
R. Boz ◽  
...  
Keyword(s):  
Wavefront Sensor ◽  
Deformable Mirror ◽  
Environmental Testing

Space active optics: performance of a deformable mirror for in-situ wave-front correction in space telescopes

2012 ◽  
Author(s):  
Marie Laslandes ◽  
Claire Hourtoule ◽  
Emmanuel Hugot ◽  
Marc Ferrari ◽  
Céline Lopez ◽  
...  
Keyword(s):  
Wave Front ◽  
Deformable Mirror ◽  
Space Telescopes ◽  
Active Optics

scholarly journals Unimorph deformable mirror for space telescopes: design and manufacturing

2015 ◽  
Vol 23 (15) ◽  
pp. 19469 ◽  
Author(s):  
Peter Rausch ◽  
Sven Verpoort ◽  
Ulrich Wittrock
Keyword(s):  
Deformable Mirror ◽  
Space Telescopes ◽  
Design And Manufacturing

Large-aperture deformable mirror correction of tiled-grating wavefront error

2006 ◽  
Vol 133 ◽  
pp. 645-648 ◽  
Author(s):  
B. E. Kruschwitz ◽  
R. Jungquist ◽  
J. Qiao ◽  
S. Abbey ◽  
S. E. Dean ◽  
...  
Keyword(s):  
Deformable Mirror ◽  
Large Aperture ◽  
Wavefront Error

Study and manufacture of a novel micro-deformable mirror

2003 ◽  
Author(s):  
Hongbin Yu ◽  
Haiqing Chen ◽  
Zimin Zhu ◽  
Chao Wang ◽  
Dacheng Zhang ◽  
...  
Keyword(s):  
Deformable Mirror

Correcting for Spherical Aberrations in Solid Immersion Microscopy Using a Deformable Mirror

2011 ◽  
Author(s):  
Y. Lu ◽  
E. Ramsay ◽  
C. Stockbridge ◽  
F. H. Koklu ◽  
A. Yurt ◽  
...  
Keyword(s):  
Failure Analysis ◽  
Error Correction ◽  
Deformable Mirror ◽  
Wafer Thickness ◽  
Wavefront Error ◽  
Substrate Wafer ◽  
Thickness Error

Abstract We present a method for correcting spherical aberrations in solid immersion microscopy through the use of a deformable mirror. Aberrations in solid immersion imaging for failure analysis can be induced through off-axis imaging, errors in lens fabrication or mismatch of design and substrate wafer thickness. RMS wavefront error correction of 30% is demonstrated in the case of substrate wafer thickness error.

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