Correcting for Spherical Aberrations in Solid Immersion Microscopy Using a Deformable Mirror
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Abstract We present a method for correcting spherical aberrations in solid immersion microscopy through the use of a deformable mirror. Aberrations in solid immersion imaging for failure analysis can be induced through off-axis imaging, errors in lens fabrication or mismatch of design and substrate wafer thickness. RMS wavefront error correction of 30% is demonstrated in the case of substrate wafer thickness error.
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2006 ◽
Vol 133
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pp. 645-648
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2008 ◽
Vol 488
(1)
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pp. L9-L12
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2014 ◽
Vol 91
(10)
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pp. 1238-1243
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1979 ◽
Vol 15
(9)
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pp. 983-983
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