Integrated optical frequency domain reflectometry device for characterization of complex integrated devices
2018 ◽
Vol 26
(23)
◽
pp. 30000
◽
Luis A. Bru
◽
Daniel Pastor
◽
Pascual Muñoz
Riccardo Veronese
◽
Andrea Galtarossa
◽
Luca Palmieri
Dan Zhao
◽
Dzmitry Pustakhod
◽
Kevin Williams
◽
Xaveer Leijtens
Ole Henrik Waagaard
◽
Jon Thomas Kringlebotn
◽
Erik Magnus Bruvik
2005 ◽
Vol 23
(2)
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pp. 909-914
◽
2006 ◽
Vol 24
(11)
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pp. 4149-4154
◽
Mark E. Froggatt
◽
Dawn K. Gifford
◽
Steven Kreger
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Matthew Wolfe
◽
Brian J. Soller
1997 ◽
Vol 15
(7)
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pp. 1131-1141
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J.P. von der Weid
◽
R. Passy
◽
G. Mussi
◽
N. Gisin
2020 ◽
Vol 38
(17)
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pp. 4843-4849
Riccardo Veronese
◽
Andrea Galtarossa
◽
Luca Palmieri
1995 ◽
Vol 7
(6)
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pp. 667-669
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R. Passy
◽
N. Gisin
◽
J.P. Von der Weid
Senta L. Scholl
◽
Rex H. S. Bannerman
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Alexander Jantzen
◽
Sam A. Berry
◽
Alan C. Gray
◽
...
Pingyu Zhu
◽
Yongjing Li
◽
Yetian Wang
◽
Xiaopeng Sun
◽
Marcelo A. Soto