Soft-Failure Localization and Device Working Parameters Estimation in Disaggregated Scenarios

2020 ◽  
Author(s):  
S. Barzegar ◽  
E. Virgillito ◽  
M. Ruiz ◽  
A. Ferrari ◽  
A. Napoli ◽  
...  
Keyword(s):  
Parameters Estimation ◽  
Soft Failure ◽  
Working Parameters ◽  
Failure Localization

Soft Failure Localization Using Machine Learning with SDN-based Network-wide Telemetry

2020 ◽  
Author(s):  
Kayol S. Mayer ◽  
Jonathan A. Soares ◽  
Rossano P. Pinto ◽  
Christian E. Rothenberg ◽  
Dalton S. Arantes ◽  
...  
Keyword(s):  
Machine Learning ◽  
Soft Failure ◽  
Failure Localization

Demonstration of Machine-Intelligent Soft-Failure Localization Using SDN Telemetry

2021 ◽  
Author(s):  
Rossano P. Pinto ◽  
Kayol S. Mayer ◽  
Jonathan A. Soares ◽  
Dalton S. Arantes ◽  
Darli A. A. Mello ◽  
...  
Keyword(s):  
Soft Failure ◽  
Failure Localization

Soft Failure Localization in Elastic Optical Networks

2018 ◽  
Author(s):  
Alba P. Vela ◽  
Behnam Shariati ◽  
Marc Ruiz ◽  
Jaume Comellas ◽  
Luis Velasco
Keyword(s):  
Optical Networks ◽  
Soft Failure ◽  
Failure Localization

scholarly journals Soft Failure Localization During Commissioning Testing and Lightpath Operation

2017 ◽  
Vol 10 (1) ◽  
pp. A27 ◽  
Author(s):  
A. P. Vela ◽  
B. Shariati ◽  
M. Ruiz ◽  
F. Cugini ◽  
A. Castro ◽  
...  
Keyword(s):  
Soft Failure ◽  
Failure Localization

ML-based Soft-failure Localization with Partial SDN Telemetry

2021 ◽  
Author(s):  
Kayol Mayer ◽  
Jonathan Soares ◽  
Rossano Pinto ◽  
Christian Rothenberg ◽  
Dalton Arantes ◽  
...  
Keyword(s):  
Soft Failure ◽  
Failure Localization

A light optical diffractometer for electron microscopical images operating in line

1978 ◽  
Vol 36 (1) ◽  
pp. 86-87
Author(s):  
P. Bonhomme ◽  
A. Beorchia
Keyword(s):  
Electron Microscopy ◽  
Electron Transfer ◽  
Electron Microscope ◽  
Image Converter ◽  
Coherent Light ◽  
Spatial Filters ◽  
Electron Image ◽  
Electron Microscopical ◽  
Working Parameters ◽  
Amorphous Part

We have already described (1.2.3) a device using a pockel's effect light valve as a microscopical electron image converter. This converter can be read out with incoherent or coherent light. In the last case we can set in line with the converter an optical diffractometer. Now, electron microscopy developments have pointed out different advantages of diffractometry. Indeed diffractogram of an image of a thin amorphous part of a specimen gives information about electron transfer function and a single look at a diffractogram informs on focus, drift, residual astigmatism, and after standardizing, on periods resolved (4.5.6). These informations are obvious from diffractogram but are usualy obtained from a micrograph, so that a correction of electron microscope parameters cannot be realized before recording the micrograph. Diffractometer allows also processing of images by setting spatial filters in diffractogram plane (7) or by reconstruction of Fraunhofer image (8). Using Electrotitus read out with coherent light and fitted to a diffractometer; all these possibilities may be realized in pseudoreal time, so that working parameters may be optimally adjusted before recording a micrograph or before processing an image.

Multipath parameters estimation with a reduced complexity unitary-SAGE algorithm

2003 ◽  
Vol 14 (6) ◽  
pp. 515-528 ◽  
Author(s):  
Chor Min Tan ◽  
Mark A. Beach ◽  
Andrew Nix
Keyword(s):  
Parameters Estimation ◽  
Reduced Complexity

Automatic Parameters Estimation of the D. Klatt Phoneme Duration Model

Informatica ◽  
2016 ◽  
Vol 27 (3) ◽  
pp. 573-586
Author(s):  
Pijus Kasparaitis ◽  
Margarita Beniušė
Keyword(s):  
Parameters Estimation ◽  
Duration Model
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