Spectral signatures of transverse optical modes in semiconductor nanowires
Crystallographic Structure of 8H- and 10H-SiC Analyzed by Raman Spectroscopy and Diffraction Methods
2014 ◽
Vol 778-780
◽
pp. 479-482
1991 ◽
Vol 47
(3-4)
◽
pp. 315-322
◽
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