Crystallographic Structure of 8H- and 10H-SiC Analyzed by Raman Spectroscopy and Diffraction Methods

2014 ◽  
Vol 778-780 ◽  
pp. 479-482
Author(s):  
Tomoaki Hatayama ◽  
Ryota Hori ◽  
Hiroshi Yano ◽  
Takashi Fuyuki
Keyword(s):  
Raman Spectroscopy ◽  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Transverse Optical ◽  
Crystallographic Structure ◽  
Laue Diffraction ◽  
Transmission Electron ◽  
Optical Modes ◽  
Crystallographic Structures

Crystallographic structures of 8H-and 10H-SiC crystals were analyzed by the Raman spectroscopy and diffraction methods. Two and four transverse-optical modes for 8H-and 10H-SiC were observed, and their values were different from those of 4H-and 6H-SiC. Crystallinity for the wide and narrow areas of these crystals was analyzed by the Laue diffraction and the transmission electron microscope, respectively. Based on these results, the stacking sequences of these polytype were discussed.

scholarly journals PEMANFAATAN TEKNIK HEM UNTUK PENUMBUHAN CNT DARI GRAFIT MENGGUNAKAN Ni SEBAGAI KATALIS = UTILIZATION OF HEM TECHNIQUE FOR GROWTH OF CNT FROM GRAPHITE POWDERS BY USING Ni AS CATALYST

2016 ◽  
Vol 10 (1) ◽  
pp. 35-40
Author(s):  
Yunasfi . ◽  
P. Purwanto ◽  
Mashadi .
Keyword(s):  
Particle Size ◽  
Raman Spectroscopy ◽  
Electron Microscope ◽  
Carbon Nanotube ◽  
Surface Area ◽  
Transmission Electron Microscope ◽  
Milling Time ◽  
High Energy ◽  
Milling Process ◽  
Transmission Electron

Utilization of HEM (high energy milling) technique for growth of CNT (carbon nanotube) from graphite powders by using Ni as catalyst was carried out. Milling process performed on a mixture of graphite powder and nickel powder (Ni-C powders) with the ratio of weight percent of 98%: 2%, with a variation of milling time between 25 up to 75 hours. Characterization using PSA (Powder Size Analyzer), SAA (Surface Area Analyzer), TEM (Transmission Electron Microscope) and Raman Spectroscopy performed to obtain information about particle size, surface area, morphology and the structure bonding of the milled powder respectively. The analysis results of Ni-C powders using PSA and SAA showed the smallest particle size and biggest surface area obtained after milling process for 50 hours, i.e. 80 nm and 705 m2/g, respectively. TEM observations revealed formation of flat fibers which quantity increased with increasing milling time. This flattened fiber behave as an initiator for the growth of CNTs. Ni-C powder milling for 50 hours results more clearly show the growth of CNTs. Analysis by Raman Spectroscopy showed two bands at 1582 cm−1 as a peak of G band and at 1350 cm-1 as a peak of D band. These spectra are typical for sp2 structure. The position of G band peak is close to 1600 cm-1 as the evidence of a change to nano-crystalline graphite. The highest intensity of D band shown in the milling process for 50 hours, which indicates that this milling time produces more graphite-like structure compared to other conditions, and is predicted good for growing CNTs. AbstrakPemanfaatan teknik HEM (High Energy Milling) untuk penumbuhan CNT (carbon nanotube) dari serbuk grafit dengan menggunakan Ni sebagai katalis. Proses milling dilakukan terhadap campuran serbuk grafit dan serbuk nikel (serbuk Ni-C) dengan perbandingan berat 98% : 2%, dengan variasi waktu milling antara 25-75 jam. Karakterisasi menggunakan fasilitas PSA (Particle Size Analyzer), SAA (Surface Area Analyzer), dan TEM (Transmission Electron Microscope) serta Raman Spektroscopy yang masing-masingnya untuk mendapatkan informasi tentang ukuran partikel, luas permukaan dan morfologi serta struktur ikatan serbuk hasil milling. Hasil analisis serbuk Ni-C dengan PSA dan SAA menunjukkan ukuran partikel paling kecil dan luas permukaan paling besar diperoleh setelah proses milling selama 50 jam, masing-masing 80 nm dan 705 m2/g. Pengamatan TEM menunjukkan serbuk-serbuk berbentuk serat pipih dengan kuantitas yang meningkat dengan bertambahnya waktu milling. Serat pipih ini perupakan cikal bakal penumbuhan CNT. Serbuk Ni-C hasil milling menunjukkan penumbuhan CNT terlihat lebih jelas setelah milling selama 50 jam. Hasil analisis dengan Raman Spectroscopy memperlihatkan puncak G band pada bilangan gelombang 1582 cm−1 yang merupakan spektrum untuk struktur sp2 dari grafit dan puncak D band pada bilangan gelombang 1350 cm-1 yang mungkin merupakan deformasi struktur grafit. Posisi puncak G band mendekati 1600 cm-1 menjadi bukti perubahan ke grafit nano kristal. Intensitas D band tertinggi ditunjukkan oleh sistem komposit Ni-C hasil proses milling selama 50 jam dan hal ini sebagai indikasi bahwa proses milling selama 50 jam terhadap sistem komposit Ni-C lebih berstruktur mirip grafit (graphitic-like material) dibanding kondisi lainnya dan diprediksi bagus untuk menumbuhkan CNT. Dengan demikian, waktu milling yang optimal untuk penumbuhan CNT dari serbuk grafit dengan menggunakan Ni sebagai katalis adalah adalah 50 jam.  

Crystallization and Morphology of Glassy Sanbornite

2011 ◽  
Vol 485 ◽  
pp. 301-304 ◽  
Author(s):  
Yoshihiro Takahashi ◽  
Rie Ihara ◽  
Takumi Fujiwara ◽  
Minoru Osada
Keyword(s):  
Raman Spectroscopy ◽  
Electron Microscope ◽  
Silicate Glass ◽  
Transmission Electron Microscope ◽  
Structural Similarity ◽  
Aggregate Structure ◽  
Barium Silicate ◽  
Transmission Electron ◽  
Heat Treated

We investigated the crystallization and resulting morphology of a stoichiometric barium-silicate glass 1BaO-2SiO2 (glassy sanbornite) by using transmission electron microscope and Raman spectroscopy. A crystalline aggregate structure consisting of a Ba5Si8O21 phase (trunk) and a β-BaSi2O5 phase (branch) was observed in the heat-treated glassy sanbornite. The Ba-richer phase of Ba5Si8O21 precipitated prior to the formation of the stoichiometric β-BaSi2O5 phase, suggesting the presence of the region in which the Ba ions are enriched or cohesively distributed. A considerable structural similarity between the glassy sanbornite and the Ba5Si8O21 phase was also suggested in this study.

A Reproducible Selective Stain for Cardiac Sarcoplasmic Reticulum

1974 ◽  
Vol 32 ◽  
pp. 214-215
Author(s):  
R. A. Waugh ◽  
J. R. Sommer
Keyword(s):  
Complex System ◽  
Electron Microscope ◽  
Sarcoplasmic Reticulum ◽  
Transmission Electron Microscope ◽  
Electron Microscopic ◽  
Cardiac Sarcoplasmic Reticulum ◽  
Transmission Electron

Cardiac sarcoplasmic reticulum (SR) is a complex system of intracellular tubules that, due to their small size and juxtaposition to such electron-dense structures as mitochondria and myofibrils, are often inconspicuous in conventionally prepared electron microscopic material. This study reports a method with which the SR is selectively “stained” which facilitates visualizationwith the transmission electron microscope.

Surface Structure of the Spores of Glugea Weissenbergi

1969 ◽  
Vol 27 ◽  
pp. 238-239
Author(s):  
Sanford H. Vernick ◽  
Anastasios Tousimis ◽  
Victor Sprague
Keyword(s):  
Electron Microscope ◽  
Surface Structure ◽  
Transmission Electron Microscope ◽  
Mature Spore ◽  
Spore Surface ◽  
Sectioned Material ◽  
Transmission Electron ◽  
Surface Detail

Recent electron microscope studies have greatly expanded our knowledge of the structure of the Microsporida, particularly of the developing and mature spore. Since these studies involved mainly sectioned material, they have revealed much internal detail of the spores but relatively little surface detail. This report concerns observations on the spore surface by means of the transmission electron microscope.

A New High Resolution Transmission Electron Microscope with Second-Zone Objective Lens

1969 ◽  
Vol 27 ◽  
pp. 176-177 ◽  
Author(s):  
H. Tochigi ◽  
H. Uchida ◽  
S. Shirai ◽  
K. Akashi ◽  
D. J. Evins ◽  
...  
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Transmission Electron Microscope ◽  
Objective Lens ◽  
High Excitation ◽  
Transmission Electron ◽  
New Instrument

A New High Excitation Objective Lens (Second-Zone Objective Lens) was discussed at Twenty-Sixth Annual EMSA Meeting. A new commercially available Transmission Electron Microscope incorporating this new lens has been completed.Major advantages of the new instrument allow an extremely small beam to be produced on the specimen plane which minimizes specimen beam damages, reduces contamination and drift.

X-ray microanalysis of thin specimens in the transmission electron microscope at voltages up to 1000 Kv.

1978 ◽  
Vol 36 (1) ◽  
pp. 540-541
Author(s):  
G. Cliff ◽  
M.J. Nasir ◽  
G.W. Lorimer ◽  
N. Ridley
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Weight Fraction ◽  
Present Series ◽  
Constant Independent ◽  
X Ray ◽  
Transmission Electron ◽  
Series Of Experiments ◽  
Image Position ◽  
X Ray Absorption

In a specimen which is transmission thin to 100 kV electrons - a sample in which X-ray absorption is so insignificant that it can be neglected and where fluorescence effects can generally be ignored (1,2) - a ratio of characteristic X-ray intensities, I1/I2 can be converted into a weight fraction ratio, C1/C2, using the equationwhere k12 is, at a given voltage, a constant independent of composition or thickness, k12 values can be determined experimentally from thin standards (3) or calculated (4,6). Both experimental and calculated k12 values have been obtained for K(11<Z>19),kα(Z>19) and some Lα radiation (3,6) at 100 kV. The object of the present series of experiments was to experimentally determine k12 values at voltages between 200 and 1000 kV and to compare these with calculated values.The experiments were carried out on an AEI-EM7 HVEM fitted with an energy dispersive X-ray detector.

Aspects of microanalysis in a transmission electron microscope

1978 ◽  
Vol 36 (1) ◽  
pp. 510-511
Author(s):  
R. Sinclair ◽  
B.E. Jacobson
Keyword(s):  
Grain Size ◽  
Electron Beam ◽  
Electron Microscope ◽  
Chemical Analysis ◽  
Transmission Electron Microscope ◽  
Vapor Deposition ◽  
Critical Currents ◽  
X Ray ◽  
Fine Grain ◽  
Transmission Electron

INTRODUCTIONThe prospect of performing chemical analysis of thin specimens at any desired level of resolution is particularly appealing to the materials scientist. Commercial TEM-based systems are now available which virtually provide this capability. The purpose of this contribution is to illustrate its application to problems which would have been intractable until recently, pointing out some current limitations.X-RAY ANALYSISIn an attempt to fabricate superconducting materials with high critical currents and temperature, thin Nb3Sn films have been prepared by electron beam vapor deposition [1]. Fine-grain size material is desirable which may be achieved by codeposition with small amounts of Al2O3 . Figure 1 shows the STEM microstructure, with large (∽ 200 Å dia) voids present at the grain boundaries. Higher quality TEM micrographs (e.g. fig. 2) reveal the presence of small voids within the grains which are absent in pure Nb3Sn prepared under identical conditions. The X-ray spectrum from large (∽ lμ dia) or small (∽100 Ǻ dia) areas within the grains indicates only small amounts of A1 (fig.3).

The direct determination of magnetic domain wall profiles using a split detector STEM

1978 ◽  
Vol 36 (1) ◽  
pp. 466-467
Author(s):  
J.N. Chapman ◽  
P.E. Batson ◽  
E.M. Waddell ◽  
R.P. Ferrier
Keyword(s):  
Electron Microscope ◽  
Domain Wall ◽  
Transmission Electron Microscope ◽  
Domain Walls ◽  
Photographic Plate ◽  
Magnetic Domain ◽  
Direct Determination ◽  
Quantitative Information ◽  
Scanning Transmission Electron Microscope ◽  
Transmission Electron

By far the most commonly used mode of Lorentz microscopy in the examination of ferromagnetic thin films is the Fresnel or defocus mode. Use of this mode in the conventional transmission electron microscope (CTEM) is straightforward and immediately reveals the existence of all domain walls present. However, if such quantitative information as the domain wall profile is required, the technique suffers from several disadvantages. These include the inability to directly observe fine image detail on the viewing screen because of the stringent illumination coherence requirements, the difficulty of accurately translating part of a photographic plate into quantitative electron intensity data, and, perhaps most severe, the difficulty of interpreting this data. One solution to the first-named problem is to use a CTEM equipped with a field emission gun (FEG) (Inoue, Harada and Yamamoto 1977) whilst a second is to use the equivalent mode of image formation in a scanning transmission electron microscope (STEM) (Chapman, Batson, Waddell, Ferrier and Craven 1977), a technique which largely overcomes the second-named problem as well.

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